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Search sanctioned goods across UK and EU export control lists in one place. This tool covers dual-use items, military equipment, and other restricted goods and technologies. Each entry includes the specific goods description, issuing authority, countries subject to import or export restrictions, and the relevant sanctions programme. This helps compliance and trade teams determine whether an item is subject to import or export prohibitions.

Use the filters to narrow results by authority, target state, or sanctions programme. Whether you’re checking a single HS code or reviewing an entire category, the sanctioned goods list is updated as new designations and programme consolidated changes are published.

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  • Good

    Converters and harmonic mixers that are any of the following: (a) Designed to extend the frequency range of ‘signal analysers’ beyond 90 GHz; (b) Designed to extend the operating range of signal generators as follows: 1. Beyond 90 GHz; 2. To an output power greater than 100 mW (20 dBm) anywhere within the frequency range exceeding 43,5 GHz but not exceeding 90 GHz; (c) Designed to extend the operating range of network analysers as follows: 1. Beyond 110 GHz; 2. To an output power greater than 31,62 mW (15 dBm) anywhere within the frequency range exceeding 43,5 GHz but not exceeding 90 GHz; 3. To an output power greater than 1 mW (0 dBm) anywhere within the frequency range exceeding 90 GHz but not exceeding 110 GHz; or (d) Designed to extend the frequency range of microwave test receivers beyond 110 GHz;

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.014
    Code: 3A001
    Good

    Converters and harmonic mixers that are any of the following: (a) Designed to extend the frequency range of ‘signal analysers’ beyond 90 GHz; (b) Designed to extend the operating range of signal generators as follows: 1. Beyond 90 GHz; 2. To an output power greater than 100 mW (20 dBm) anywhere within the frequency range exceeding 43,5 GHz but not exceeding 90 GHz; (c) Designed to extend the operating range of network analysers as follows: 1. Beyond 110 GHz; 2. To an output power greater than 31,62 mW (15 dBm) anywhere within the frequency range exceeding 43,5 GHz but not exceeding 90 GHz; 3. To an output power greater than 1 mW (0 dBm) anywhere within the frequency range exceeding 90 GHz but not exceeding 110 GHz; or (d) Designed to extend the frequency range of microwave test receivers beyond 110 GHz;

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.014
    Code: 3A001
  • Good

    Electronically or magnetically tunable band-pass or band-stop filters, having more than 5 tunable resonators capable of tuning across a 1,5:1 frequency band (fmax/fmin) in less than 10 μs and having any of the following: (a) A band-pass bandwidth of more than 0,5 % of centre frequency; or (b) A band-stop bandwidth of less than 0,5 % of centre frequency;

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.013
    Code: 3A001
    Good

    Electronically or magnetically tunable band-pass or band-stop filters, having more than 5 tunable resonators capable of tuning across a 1,5:1 frequency band (fmax/fmin) in less than 10 μs and having any of the following: (a) A band-pass bandwidth of more than 0,5 % of centre frequency; or (b) A band-stop bandwidth of less than 0,5 % of centre frequency;

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.013
    Code: 3A001
  • Good

    Microwave solid-state amplifiers and microwave assemblies/modules containing microwave solid-state amplifiers that are any of the following: (a) Rated for operation at frequencies exceeding 2,7 GHz up to and including 6,8 GHz with a ‘fractional bandwidth’ of greater than 15 % and having any of the following: 1. A peak saturated power output greater than 500 W (57 dBm) at any frequency exceeding 2,7 GHz up to and including 2,9 GHz; 2. A peak saturated power output greater than 270 W (54,3 dBm) at any frequency exceeding 2,9 GHz up to and including 3,2 GHz; 3. A peak saturated power output greater than 200 W (53 dBm) at any frequency exceeding 3,2 GHz up to and including 3,7 GHz; or 4. A peak saturated power output greater than 90 W (49,54 dBm) at any frequency exceeding 3,7 GHz up to and including 6,8 GHz; (b) Rated for operation at frequencies greater than 6,8 GHz up to and including 31,8 GHz with a ‘fractional bandwidth’ of greater than 10 % and having any of the following: 1. A peak saturated power output greater than 70 W (48,54 dBm) at any frequency exceeding 6,8 GHz up to and including 8,5 GHz; 2. A peak saturated power output greater than 50 W (47 dBm) at any frequency exceeding 8,5 GHz up to and including 12 GHz; 3. A peak saturated power output greater than 30 W (44,77 dBm) at any frequency exceeding 12 GHz up to and including 16 GHz; or 4. A peak saturated power output greater than 20 W (43 dBm) at any frequency exceeding 16 GHz up to and including 31,8 GHz; (c) Rated for operation with a peak saturated power output greater than 0,5 W (27 dBm) at any frequency exceeding 31,8 GHz up to and including 37 GHz; (d) Rated for operation with a peak saturated power output greater than 2 W (33 dBm) at any frequency exceeding 37 GHz up to and including 43,5 GHz, and with a ‘fractional bandwidth’ of greater than 10 %; (e) Rated for operation at frequencies exceeding 43,5 GHz and having any of the following: 1. A peak saturated power output greater than 0,2 W (23 dBm) at any frequency exceeding 43,5 GHz up to and including 75 GHz, and with a ‘fractional bandwidth’ of greater than 10 %; 2. A peak saturated power output greater than 20 mW (13 dBm) at any frequency exceeding 75 GHz up to and including 90 GHz, and with a ‘fractional bandwidth’ of greater than 5 %; or 3. A peak saturated power output greater than 0,1 nW (- 70 dBm) at any frequency exceeding 90 GHz; Note : The status of an item whose rated operating frequency includes frequencies listed in more than one frequency range is determined by the lowest peak saturated power output threshold.

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.012
    Code: 3A001
    Good

    Microwave solid-state amplifiers and microwave assemblies/modules containing microwave solid-state amplifiers that are any of the following: (a) Rated for operation at frequencies exceeding 2,7 GHz up to and including 6,8 GHz with a ‘fractional bandwidth’ of greater than 15 % and having any of the following: 1. A peak saturated power output greater than 500 W (57 dBm) at any frequency exceeding 2,7 GHz up to and including 2,9 GHz; 2. A peak saturated power output greater than 270 W (54,3 dBm) at any frequency exceeding 2,9 GHz up to and including 3,2 GHz; 3. A peak saturated power output greater than 200 W (53 dBm) at any frequency exceeding 3,2 GHz up to and including 3,7 GHz; or 4. A peak saturated power output greater than 90 W (49,54 dBm) at any frequency exceeding 3,7 GHz up to and including 6,8 GHz; (b) Rated for operation at frequencies greater than 6,8 GHz up to and including 31,8 GHz with a ‘fractional bandwidth’ of greater than 10 % and having any of the following: 1. A peak saturated power output greater than 70 W (48,54 dBm) at any frequency exceeding 6,8 GHz up to and including 8,5 GHz; 2. A peak saturated power output greater than 50 W (47 dBm) at any frequency exceeding 8,5 GHz up to and including 12 GHz; 3. A peak saturated power output greater than 30 W (44,77 dBm) at any frequency exceeding 12 GHz up to and including 16 GHz; or 4. A peak saturated power output greater than 20 W (43 dBm) at any frequency exceeding 16 GHz up to and including 31,8 GHz; (c) Rated for operation with a peak saturated power output greater than 0,5 W (27 dBm) at any frequency exceeding 31,8 GHz up to and including 37 GHz; (d) Rated for operation with a peak saturated power output greater than 2 W (33 dBm) at any frequency exceeding 37 GHz up to and including 43,5 GHz, and with a ‘fractional bandwidth’ of greater than 10 %; (e) Rated for operation at frequencies exceeding 43,5 GHz and having any of the following: 1. A peak saturated power output greater than 0,2 W (23 dBm) at any frequency exceeding 43,5 GHz up to and including 75 GHz, and with a ‘fractional bandwidth’ of greater than 10 %; 2. A peak saturated power output greater than 20 mW (13 dBm) at any frequency exceeding 75 GHz up to and including 90 GHz, and with a ‘fractional bandwidth’ of greater than 5 %; or 3. A peak saturated power output greater than 0,1 nW (- 70 dBm) at any frequency exceeding 90 GHz; Note : The status of an item whose rated operating frequency includes frequencies listed in more than one frequency range is determined by the lowest peak saturated power output threshold.

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.012
    Code: 3A001
  • Good

    Discrete microwave transistors that are any of the following: a. Rated for operation at frequencies exceeding 2,7 GHz up to and including 6,8 GHz and having any of the following: 1. A peak saturated power output greater than 400 W (56 dBm) at any frequency exceeding 2,7 GHz up to and including 2,9 GHz; 2. A peak saturated power output greater than 205 W (53,12 dBm) at any frequency exceeding 2,9 GHz up to and including 3,2 GHz; 3. A peak saturated power output greater than 115 W (50,61 dBm) at any frequency exceeding 3,2 GHz up to and including 3,7 GHz; or 4. A peak saturated power output greater than 60 W (47,78 dBm) at any frequency exceeding 3,7 GHz up to and including 6,8 GHz; b. Rated for operation at frequencies exceeding 6,8 GHz up to and including 31,8 GHz and having any of the following: 1. A peak saturated power output greater than 50 W (47 dBm) at any frequency exceeding 6,8 GHz up to and including 8,5 GHz; 2. A peak saturated power output greater than 15 W (41,76 dBm) at any frequency exceeding 8,5 GHz up to and including 12 GHz; 3. A peak saturated power output greater than 40 W (46 dBm) at any frequency exceeding 12 GHz up to and including 16 GHz; or 4. A peak saturated power output greater than 7 W (38,45 dBm) at any frequency exceeding 16 GHz up to and including 31,8 GHz; c. Rated for operation with a peak saturated power output greater than 0,5 W (27 dBm) at any frequency exceeding 31,8 GHz up to and including 37 GHz; d. Rated for operation with a peak saturated power output greater than 1 W (30 dBm) at any frequency exceeding 37 GHz up to and including 43,5 GHz; or e. Rated for operation with a peak saturated power output greater than 0,1 nW (-70 dBm) at any frequency exceeding 43,5 GHz; Notes: 1. The status of a transistor whose rated operating frequency includes frequencies listed in more than one frequency range is determined by the lowest peak saturated power output threshold. 2. This category includes bare dice, dice mounted on carriers or dice mounted in packages. Some discrete transistors may also be referred to as power amplifiers.

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.011
    Code: 3A001
    Good

    Discrete microwave transistors that are any of the following: a. Rated for operation at frequencies exceeding 2,7 GHz up to and including 6,8 GHz and having any of the following: 1. A peak saturated power output greater than 400 W (56 dBm) at any frequency exceeding 2,7 GHz up to and including 2,9 GHz; 2. A peak saturated power output greater than 205 W (53,12 dBm) at any frequency exceeding 2,9 GHz up to and including 3,2 GHz; 3. A peak saturated power output greater than 115 W (50,61 dBm) at any frequency exceeding 3,2 GHz up to and including 3,7 GHz; or 4. A peak saturated power output greater than 60 W (47,78 dBm) at any frequency exceeding 3,7 GHz up to and including 6,8 GHz; b. Rated for operation at frequencies exceeding 6,8 GHz up to and including 31,8 GHz and having any of the following: 1. A peak saturated power output greater than 50 W (47 dBm) at any frequency exceeding 6,8 GHz up to and including 8,5 GHz; 2. A peak saturated power output greater than 15 W (41,76 dBm) at any frequency exceeding 8,5 GHz up to and including 12 GHz; 3. A peak saturated power output greater than 40 W (46 dBm) at any frequency exceeding 12 GHz up to and including 16 GHz; or 4. A peak saturated power output greater than 7 W (38,45 dBm) at any frequency exceeding 16 GHz up to and including 31,8 GHz; c. Rated for operation with a peak saturated power output greater than 0,5 W (27 dBm) at any frequency exceeding 31,8 GHz up to and including 37 GHz; d. Rated for operation with a peak saturated power output greater than 1 W (30 dBm) at any frequency exceeding 37 GHz up to and including 43,5 GHz; or e. Rated for operation with a peak saturated power output greater than 0,1 nW (-70 dBm) at any frequency exceeding 43,5 GHz; Notes: 1. The status of a transistor whose rated operating frequency includes frequencies listed in more than one frequency range is determined by the lowest peak saturated power output threshold. 2. This category includes bare dice, dice mounted on carriers or dice mounted in packages. Some discrete transistors may also be referred to as power amplifiers.

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.011
    Code: 3A001
  • Good

    ‘Monolithic Microwave Integrated Circuit’ (‘MMIC’) amplifiers that are any of the following: (a) Rated for operation at frequencies exceeding 2,7 GHz up to and including 6,8 GHz with a ‘fractional bandwidth’ of greater than 15 %, and having any of the following: 1. A peak saturated power output greater than 75 W (48,75 dBm) at any frequency exceeding 2,7 GHz up to and including 2,9 GHz; 2. A peak saturated power output greater than 55 W (47,4 dBm) at any frequency exceeding 2,9 GHz up to and including 3,2 GHz; 3. A peak saturated power output greater than 40 W (46 dBm) at any frequency exceeding 3,2 GHz up to and including 3,7 GHz; or 4. A peak saturated power output greater than 20 W (43 dBm) at any frequency exceeding 3,7 GHz up to and including 6,8 GHz; (b) Rated for operation at frequencies exceeding 6,8 GHz up to and including 16 GHz with a ‘fractional bandwidth’ of greater than 10 %, and having any of the following: 1. A peak saturated power output greater than 10W (40 dBm) at any frequency exceeding 6,8 GHz up to and including 8,5 GHz; or 2. A peak saturated power output greater than 5W (37 dBm) at any frequency exceeding 8,5 GHz up to and including 16 GHz; (c) Rated for operation with a peak saturated power output greater than 3 W (34,77 dBm) at any frequency exceeding 16 GHz up to and including 31,8 GHz, and with a ‘fractional bandwidth’ of greater than 10 %; (d) Rated for operation with a peak saturated power output greater than 0,1n W (– 70 dBm) at any frequency exceeding 31,8 GHz up to and including 37 GHz; (e) Rated for operation with a peak saturated power output greater than 1 W (30 dBm) at any frequency exceeding 37 GHz up to and including 43,5 GHz, and with a ‘fractional bandwidth’ of greater than 10 %; (f) Rated for operation with a peak saturated power output greater than 31,62 mW (15 dBm) at any frequency exceeding 43,5 GHz up to and including 75 GHz, and with a ‘fractional bandwidth’ of greater than 10 %; (g) Rated for operation with a peak saturated power output greater than 10 mW (10 dBm) at any frequency exceeding 75 GHz up to and including 90 GHz, and with a ‘fractional bandwidth’ of greater than 5 %; or (h) Rated for operation with a peak saturated power output greater than 0,1 nW (– 70 dBm) at any frequency exceeding 90 GHz; Notes: 1. The status of the MMIC whose rated operating frequency includes frequencies listed in more than one frequency range is determined by the lowest peak saturated power output threshold. 2. This category does not apply to MMICs if they are specially designed for other applications, e.g., telecommunications, radar, automobiles.

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.010
    Code: 3A001
    Good

    ‘Monolithic Microwave Integrated Circuit’ (‘MMIC’) amplifiers that are any of the following: (a) Rated for operation at frequencies exceeding 2,7 GHz up to and including 6,8 GHz with a ‘fractional bandwidth’ of greater than 15 %, and having any of the following: 1. A peak saturated power output greater than 75 W (48,75 dBm) at any frequency exceeding 2,7 GHz up to and including 2,9 GHz; 2. A peak saturated power output greater than 55 W (47,4 dBm) at any frequency exceeding 2,9 GHz up to and including 3,2 GHz; 3. A peak saturated power output greater than 40 W (46 dBm) at any frequency exceeding 3,2 GHz up to and including 3,7 GHz; or 4. A peak saturated power output greater than 20 W (43 dBm) at any frequency exceeding 3,7 GHz up to and including 6,8 GHz; (b) Rated for operation at frequencies exceeding 6,8 GHz up to and including 16 GHz with a ‘fractional bandwidth’ of greater than 10 %, and having any of the following: 1. A peak saturated power output greater than 10W (40 dBm) at any frequency exceeding 6,8 GHz up to and including 8,5 GHz; or 2. A peak saturated power output greater than 5W (37 dBm) at any frequency exceeding 8,5 GHz up to and including 16 GHz; (c) Rated for operation with a peak saturated power output greater than 3 W (34,77 dBm) at any frequency exceeding 16 GHz up to and including 31,8 GHz, and with a ‘fractional bandwidth’ of greater than 10 %; (d) Rated for operation with a peak saturated power output greater than 0,1n W (– 70 dBm) at any frequency exceeding 31,8 GHz up to and including 37 GHz; (e) Rated for operation with a peak saturated power output greater than 1 W (30 dBm) at any frequency exceeding 37 GHz up to and including 43,5 GHz, and with a ‘fractional bandwidth’ of greater than 10 %; (f) Rated for operation with a peak saturated power output greater than 31,62 mW (15 dBm) at any frequency exceeding 43,5 GHz up to and including 75 GHz, and with a ‘fractional bandwidth’ of greater than 10 %; (g) Rated for operation with a peak saturated power output greater than 10 mW (10 dBm) at any frequency exceeding 75 GHz up to and including 90 GHz, and with a ‘fractional bandwidth’ of greater than 5 %; or (h) Rated for operation with a peak saturated power output greater than 0,1 nW (– 70 dBm) at any frequency exceeding 90 GHz; Notes: 1. The status of the MMIC whose rated operating frequency includes frequencies listed in more than one frequency range is determined by the lowest peak saturated power output threshold. 2. This category does not apply to MMICs if they are specially designed for other applications, e.g., telecommunications, radar, automobiles.

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.010
    Code: 3A001
  • Good

    Microwave or millimetre wave items, as follows: (a) Travelling-wave ‘vacuum electronic devices’, pulsed or continuous wave; 1. Devices operating at frequencies exceeding 31,8 GHz; 2. Devices having a cathode heater with a turn-on time to rated RF power of less than 3 seconds; 3. Coupled cavity devices, or derivatives thereof, with a ‘fractional bandwidth’ of more than 7 % or a peak power exceeding 2,5 kW; 4. Devices based on helix, folded waveguide, or serpentine waveguide circuits, or derivatives thereof, having any of the following: a. An ‘instantaneous bandwidth’ of more than one octave, and average power (expressed in kW) times frequency (expressed in GHz) of more than 0,5; b. An ‘instantaneous bandwidth’ of one octave or less, and average power (expressed in kW) times frequency (expressed in GHz) of more than 1; c. Being ‘space-qualified’; or d. Having a gridded electron gun; 5. Devices with a ‘fractional bandwidth’ of greater than or equal to 10 %, with any of the following: a. An annular electron beam; b. A non-axisymmetric electron beam; or c. Multiple electron beams; (b) Crossed-field amplifier ‘vacuum electronic devices’ with a gain of more than 17 dB; (c) Thermionic cathodes designed for ‘vacuum electronic devices’ producing an emission current density at rated operating conditions exceeding 5 A/cm 2 or a pulsed (non-continuous) current density at rated operating conditions exceeding 10 A/cm 2 ; (d) ‘Vacuum electronic devices’ with the capability to operate in a ‘dual mode’; Technical note : ‘Dual mode’ means that the ‘vacuum electronic device’ beam current can be intentionally changed between continuous-wave and pulsed mode operation by use of a grid and produces a peak pulse output power greater than the continuous-wave output power.

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.009
    Code: 3A001
    Good

    Microwave or millimetre wave items, as follows: (a) Travelling-wave ‘vacuum electronic devices’, pulsed or continuous wave; 1. Devices operating at frequencies exceeding 31,8 GHz; 2. Devices having a cathode heater with a turn-on time to rated RF power of less than 3 seconds; 3. Coupled cavity devices, or derivatives thereof, with a ‘fractional bandwidth’ of more than 7 % or a peak power exceeding 2,5 kW; 4. Devices based on helix, folded waveguide, or serpentine waveguide circuits, or derivatives thereof, having any of the following: a. An ‘instantaneous bandwidth’ of more than one octave, and average power (expressed in kW) times frequency (expressed in GHz) of more than 0,5; b. An ‘instantaneous bandwidth’ of one octave or less, and average power (expressed in kW) times frequency (expressed in GHz) of more than 1; c. Being ‘space-qualified’; or d. Having a gridded electron gun; 5. Devices with a ‘fractional bandwidth’ of greater than or equal to 10 %, with any of the following: a. An annular electron beam; b. A non-axisymmetric electron beam; or c. Multiple electron beams; (b) Crossed-field amplifier ‘vacuum electronic devices’ with a gain of more than 17 dB; (c) Thermionic cathodes designed for ‘vacuum electronic devices’ producing an emission current density at rated operating conditions exceeding 5 A/cm 2 or a pulsed (non-continuous) current density at rated operating conditions exceeding 10 A/cm 2 ; (d) ‘Vacuum electronic devices’ with the capability to operate in a ‘dual mode’; Technical note : ‘Dual mode’ means that the ‘vacuum electronic device’ beam current can be intentionally changed between continuous-wave and pulsed mode operation by use of a grid and produces a peak pulse output power greater than the continuous-wave output power.

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.009
    Code: 3A001
  • Good

    Direct Digital Synthesizer (DDS) integrated circuits having any of the following: (a) A Digital-to-Analogue Converter (DAC) clock frequency of 3,5 GHz or more and a DAC resolution of 10 bit or more, but less than 12 bit; or (b) A DAC clock frequency of 1,25 GHz or more and a DAC resolution of 12 bit or more; Technical note : The DAC clock frequency may be specified as the master clock frequency or the input clock frequency.

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.008
    Code: 3A001
    Good

    Direct Digital Synthesizer (DDS) integrated circuits having any of the following: (a) A Digital-to-Analogue Converter (DAC) clock frequency of 3,5 GHz or more and a DAC resolution of 10 bit or more, but less than 12 bit; or (b) A DAC clock frequency of 1,25 GHz or more and a DAC resolution of 12 bit or more; Technical note : The DAC clock frequency may be specified as the master clock frequency or the input clock frequency.

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.008
    Code: 3A001
  • Good

    Custom integrated circuits for which the function is unknown, or the status of the equipment in which the integrated circuits will be used is unknown to the manufacturer, having any of the following: (a) More than 1 500 terminals; (b) A typical ‘basic gate propagation delay time’ of less than 0,02 ns; or (c) An operating frequency exceeding 3 GHz;

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.007
    Code: 3A001
    Good

    Custom integrated circuits for which the function is unknown, or the status of the equipment in which the integrated circuits will be used is unknown to the manufacturer, having any of the following: (a) More than 1 500 terminals; (b) A typical ‘basic gate propagation delay time’ of less than 0,02 ns; or (c) An operating frequency exceeding 3 GHz;

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.007
    Code: 3A001
  • Good

    Neural network integrated circuits;

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.006
    Code: 3A001
    Good

    Neural network integrated circuits;

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.006
    Code: 3A001
  • Good

    4. Field programmable logic devices having any of the following: (a) A maximum number of single-ended digital input/outputs of greater than 700; or (b) An ‘aggregate one-way peak serial transceiver data rate’ of 500 Gb/s or greater; Note : This category includes — Simple Programmable Logic Devices (SPLDs); — Complex Programmable Logic Devices (CPLDs); — Field Programmable Gate Arrays (FPGAs); — Field Programmable Logic Arrays (FPLAs); — Field Programmable Interconnects (FPICs).

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.005
    Code: 3A001
    Good

    4. Field programmable logic devices having any of the following: (a) A maximum number of single-ended digital input/outputs of greater than 700; or (b) An ‘aggregate one-way peak serial transceiver data rate’ of 500 Gb/s or greater; Note : This category includes — Simple Programmable Logic Devices (SPLDs); — Complex Programmable Logic Devices (CPLDs); — Field Programmable Gate Arrays (FPGAs); — Field Programmable Logic Arrays (FPLAs); — Field Programmable Interconnects (FPICs).

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.005
    Code: 3A001
  • Good

    Electro-optical and ‘optical integrated circuits’, designed for ‘signal processing’ and having all of the following: (a) One or more than one internal ‘laser’ diode; (b) One or more than one internal light detecting element; and (c) Optical waveguides;

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.004
    Code: 3A001
    Good

    Electro-optical and ‘optical integrated circuits’, designed for ‘signal processing’ and having all of the following: (a) One or more than one internal ‘laser’ diode; (b) One or more than one internal light detecting element; and (c) Optical waveguides;

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.004
    Code: 3A001
  • Good

    ‘Microprocessor microcircuits’, ‘microcomputer microcircuits’, microcontroller microcircuits, storage integrated circuits manufactured from a compound semiconductor, analogue-to-digital converters, integrated circuits that contain analogue-to-digital converters and store or process the digitized data, digital-to-analogue converters, electro-optical or ‘optical integrated circuits’ designed for ‘signal processing’, field programmable logic devices, custom integrated circuits for which either the function is unknown or the status of the equipment in which the integrated circuit will be used is unknown, Fast Fourier Transform (FFT) processors, Electrical Erasable Programmable Read-Only Memories (EEPROMs), flash memories, Static Random-Access Memories (SRAMs) or Magnetic Random-Access Memories (MRAMs), having any of the following: (a) Rated for operation at an ambient temperature above 398 K (+ 125 °C); (b) Rated for operation at an ambient temperature below 218 K (– 55 °C); or (c) Rated for operation over the entire ambient temperature range from 218 K (– 55 °C) to 398 K (+ 125 °C); Note : This category does not apply to integrated circuits for civil automobile or railway train applications.

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.003
    Code: 3A001
    Good

    ‘Microprocessor microcircuits’, ‘microcomputer microcircuits’, microcontroller microcircuits, storage integrated circuits manufactured from a compound semiconductor, analogue-to-digital converters, integrated circuits that contain analogue-to-digital converters and store or process the digitized data, digital-to-analogue converters, electro-optical or ‘optical integrated circuits’ designed for ‘signal processing’, field programmable logic devices, custom integrated circuits for which either the function is unknown or the status of the equipment in which the integrated circuit will be used is unknown, Fast Fourier Transform (FFT) processors, Electrical Erasable Programmable Read-Only Memories (EEPROMs), flash memories, Static Random-Access Memories (SRAMs) or Magnetic Random-Access Memories (MRAMs), having any of the following: (a) Rated for operation at an ambient temperature above 398 K (+ 125 °C); (b) Rated for operation at an ambient temperature below 218 K (– 55 °C); or (c) Rated for operation over the entire ambient temperature range from 218 K (– 55 °C) to 398 K (+ 125 °C); Note : This category does not apply to integrated circuits for civil automobile or railway train applications.

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.003
    Code: 3A001
  • Good

    Integrated circuits designed or rated as radiation hardened to withstand any of the following: (a) A total dose of 5 × 10 3 Gy (Si) or higher; (b) A dose rate upset of 5 × 10 6 Gy (Si)/s or higher; or (c) A fluence (integrated flux) of neutrons (1 MeV equivalent) of 5 × 1 013 n/cm 2 or higher on silicon, or its equivalent for other materials; Note : The category above does not apply to Metal Insulator Semiconductors (MIS).

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.002
    Code: 3A001
    Good

    Integrated circuits designed or rated as radiation hardened to withstand any of the following: (a) A total dose of 5 × 10 3 Gy (Si) or higher; (b) A dose rate upset of 5 × 10 6 Gy (Si)/s or higher; or (c) A fluence (integrated flux) of neutrons (1 MeV equivalent) of 5 × 1 013 n/cm 2 or higher on silicon, or its equivalent for other materials; Note : The category above does not apply to Metal Insulator Semiconductors (MIS).

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.002
    Code: 3A001
  • Good

    Electronic items, as follows: (a) General-purpose integrated circuits, as follows: Notes: 1. The status of wafers (finished or unfinished), in which the function has been determined, is to be evaluated against the parameters of 3A001.a. 2. Integrated circuits include the following types: — ‘Monolithic integrated circuits’; — ‘Hybrid integrated circuits’; — ‘Multichip integrated circuits’; — ‘Film-type integrated circuits’, including silicon-on-sapphire integrated circuits; — ‘Optical integrated circuits’; — ‘Three-dimensional integrated circuits’; — ‘Monolithic Microwave Integrated Circuits’ (‘MMICs’).

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.001
    Code: 3A001
    Good

    Electronic items, as follows: (a) General-purpose integrated circuits, as follows: Notes: 1. The status of wafers (finished or unfinished), in which the function has been determined, is to be evaluated against the parameters of 3A001.a. 2. Integrated circuits include the following types: — ‘Monolithic integrated circuits’; — ‘Hybrid integrated circuits’; — ‘Multichip integrated circuits’; — ‘Film-type integrated circuits’, including silicon-on-sapphire integrated circuits; — ‘Optical integrated circuits’; — ‘Three-dimensional integrated circuits’; — ‘Monolithic Microwave Integrated Circuits’ (‘MMICs’).

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A3.001
    Code: 3A001
  • Good

    Dimensional inspection or measuring systems, equipment and ‘electronic assemblies’, as follows: (a) Computer-controlled or ‘numerically controlled’ Coordinate Measuring Machines (CMM), having a three-dimensional (volumetric) maximum permissible error of length measurement (E0,MPE) at any point within the operating range of the machine (i.e., within the length of axes) equal to or less (better) than 1,7 + L/1 000 μm (L is the measured length in mm), according to ISO 10360-2 (2009); (b) Linear and angular displacement measuring instruments, as follows: 1. ‘Linear displacement’ measuring instruments having any of the following: a. Non-contact-type measuring systems with a ‘resolution’ equal to or less (better) than 0,2 μm within a measuring range up to 0,2 mm; b. Linear Variable Differential Transformer (LVDT) systems: 1. Having any of the following: a. ‘Linearity’ equal to or less (better) than 0,1 % measured from 0 to the ‘full operating range’, for LVDTs with a ‘full operating range’ up to and including ± 5 mm; or b. ‘Linearity’ equal to or less (better) than 0,1 % measured from 0 to 5 mm for LVDTs with a ‘full operating range’ greater than ± 5 mm; and 2. Drift equal to or less (better) than 0,1 % per day at a standard ambient test room temperature ± 1 K; Technical note: For the purposes of item b. above, ‘full operating range’ is half of the total possible linear displacement of the LVDT. For example, LVDTs with a ‘full operating range’ up to and including ± 5 mm can measure a total possible linear displacement of 10 mm. c. Measuring systems having all of the following: 1. Containing a ‘laser’; 2. A ‘resolution’ over their full scale of 0,200 nm or less (better); and 3. Capable of achieving a ‘measurement uncertainty’ equal to or less (better) than (1,6 + L/2 000 ) nm (L is the measured length in mm) at any point within a measuring range, when compensated for the refractive index of air and measured over a period of 30 seconds at a temperature of 20 ± 0,01 °C; or d. ‘Electronic assemblies’ specially designed to provide feedback capability in systems specified above; 2. Angular displacement measuring instruments; Note : The category above does not apply to optical instruments, such as autocollimators, using collimated light (e.g., ‘laser’ light) to detect angular displacement of a mirror. (c) Equipment for measuring surface roughness (including surface defects), by measuring optical scatter with a sensitivity of 0,5 nm or less (better).

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A2.006
    Code: 2B206
    Good

    Dimensional inspection or measuring systems, equipment and ‘electronic assemblies’, as follows: (a) Computer-controlled or ‘numerically controlled’ Coordinate Measuring Machines (CMM), having a three-dimensional (volumetric) maximum permissible error of length measurement (E0,MPE) at any point within the operating range of the machine (i.e., within the length of axes) equal to or less (better) than 1,7 + L/1 000 μm (L is the measured length in mm), according to ISO 10360-2 (2009); (b) Linear and angular displacement measuring instruments, as follows: 1. ‘Linear displacement’ measuring instruments having any of the following: a. Non-contact-type measuring systems with a ‘resolution’ equal to or less (better) than 0,2 μm within a measuring range up to 0,2 mm; b. Linear Variable Differential Transformer (LVDT) systems: 1. Having any of the following: a. ‘Linearity’ equal to or less (better) than 0,1 % measured from 0 to the ‘full operating range’, for LVDTs with a ‘full operating range’ up to and including ± 5 mm; or b. ‘Linearity’ equal to or less (better) than 0,1 % measured from 0 to 5 mm for LVDTs with a ‘full operating range’ greater than ± 5 mm; and 2. Drift equal to or less (better) than 0,1 % per day at a standard ambient test room temperature ± 1 K; Technical note: For the purposes of item b. above, ‘full operating range’ is half of the total possible linear displacement of the LVDT. For example, LVDTs with a ‘full operating range’ up to and including ± 5 mm can measure a total possible linear displacement of 10 mm. c. Measuring systems having all of the following: 1. Containing a ‘laser’; 2. A ‘resolution’ over their full scale of 0,200 nm or less (better); and 3. Capable of achieving a ‘measurement uncertainty’ equal to or less (better) than (1,6 + L/2 000 ) nm (L is the measured length in mm) at any point within a measuring range, when compensated for the refractive index of air and measured over a period of 30 seconds at a temperature of 20 ± 0,01 °C; or d. ‘Electronic assemblies’ specially designed to provide feedback capability in systems specified above; 2. Angular displacement measuring instruments; Note : The category above does not apply to optical instruments, such as autocollimators, using collimated light (e.g., ‘laser’ light) to detect angular displacement of a mirror. (c) Equipment for measuring surface roughness (including surface defects), by measuring optical scatter with a sensitivity of 0,5 nm or less (better).

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A2.006
    Code: 2B206
  • Good

    Dimensional inspection or measuring systems, equipment and ‘electronic assemblies’, as follows: (a) Computer-controlled or ‘numerically controlled’ Coordinate Measuring Machines (CMM), having a three-dimensional (volumetric) maximum permissible error of length measurement (E0,MPE) at any point within the operating range of the machine (i.e., within the length of axes) equal to or less (better) than 1,7 + L/1 000 μm (L is the measured length in mm), according to ISO 10360-2 (2009); (b) Linear and angular displacement measuring instruments, as follows: 1. ‘Linear displacement’ measuring instruments having any of the following: a. Non-contact-type measuring systems with a ‘resolution’ equal to or less (better) than 0,2 μm within a measuring range up to 0,2 mm; b. Linear Variable Differential Transformer (LVDT) systems: 1. Having any of the following: a. ‘Linearity’ equal to or less (better) than 0,1 % measured from 0 to the ‘full operating range’, for LVDTs with a ‘full operating range’ up to and including ± 5 mm; or b. ‘Linearity’ equal to or less (better) than 0,1 % measured from 0 to 5 mm for LVDTs with a ‘full operating range’ greater than ± 5 mm; and 2. Drift equal to or less (better) than 0,1 % per day at a standard ambient test room temperature ± 1 K; Technical note: For the purposes of item b. above, ‘full operating range’ is half of the total possible linear displacement of the LVDT. For example, LVDTs with a ‘full operating range’ up to and including ± 5 mm can measure a total possible linear displacement of 10 mm. c. Measuring systems having all of the following: 1. Containing a ‘laser’; 2. A ‘resolution’ over their full scale of 0,200 nm or less (better); and 3. Capable of achieving a ‘measurement uncertainty’ equal to or less (better) than (1,6 + L/2 000 ) nm (L is the measured length in mm) at any point within a measuring range, when compensated for the refractive index of air and measured over a period of 30 seconds at a temperature of 20 ± 0,01 °C; or d. ‘Electronic assemblies’ specially designed to provide feedback capability in systems specified above; 2. Angular displacement measuring instruments; Note : The category above does not apply to optical instruments, such as autocollimators, using collimated light (e.g., ‘laser’ light) to detect angular displacement of a mirror. (c) Equipment for measuring surface roughness (including surface defects), by measuring optical scatter with a sensitivity of 0,5 nm or less (better).

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A2.006
    Code: 2B006
    Good

    Dimensional inspection or measuring systems, equipment and ‘electronic assemblies’, as follows: (a) Computer-controlled or ‘numerically controlled’ Coordinate Measuring Machines (CMM), having a three-dimensional (volumetric) maximum permissible error of length measurement (E0,MPE) at any point within the operating range of the machine (i.e., within the length of axes) equal to or less (better) than 1,7 + L/1 000 μm (L is the measured length in mm), according to ISO 10360-2 (2009); (b) Linear and angular displacement measuring instruments, as follows: 1. ‘Linear displacement’ measuring instruments having any of the following: a. Non-contact-type measuring systems with a ‘resolution’ equal to or less (better) than 0,2 μm within a measuring range up to 0,2 mm; b. Linear Variable Differential Transformer (LVDT) systems: 1. Having any of the following: a. ‘Linearity’ equal to or less (better) than 0,1 % measured from 0 to the ‘full operating range’, for LVDTs with a ‘full operating range’ up to and including ± 5 mm; or b. ‘Linearity’ equal to or less (better) than 0,1 % measured from 0 to 5 mm for LVDTs with a ‘full operating range’ greater than ± 5 mm; and 2. Drift equal to or less (better) than 0,1 % per day at a standard ambient test room temperature ± 1 K; Technical note: For the purposes of item b. above, ‘full operating range’ is half of the total possible linear displacement of the LVDT. For example, LVDTs with a ‘full operating range’ up to and including ± 5 mm can measure a total possible linear displacement of 10 mm. c. Measuring systems having all of the following: 1. Containing a ‘laser’; 2. A ‘resolution’ over their full scale of 0,200 nm or less (better); and 3. Capable of achieving a ‘measurement uncertainty’ equal to or less (better) than (1,6 + L/2 000 ) nm (L is the measured length in mm) at any point within a measuring range, when compensated for the refractive index of air and measured over a period of 30 seconds at a temperature of 20 ± 0,01 °C; or d. ‘Electronic assemblies’ specially designed to provide feedback capability in systems specified above; 2. Angular displacement measuring instruments; Note : The category above does not apply to optical instruments, such as autocollimators, using collimated light (e.g., ‘laser’ light) to detect angular displacement of a mirror. (c) Equipment for measuring surface roughness (including surface defects), by measuring optical scatter with a sensitivity of 0,5 nm or less (better).

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A2.006
    Code: 2B006
  • Good

    Numerically controlled optical finishing machine tools equipped for selective material removal to produce non-spherical optical surfaces having all of the following characteristics: (a) Finishing the form to less (better) than 1,0 μm; (b) Finishing to a roughness less (better) than 100 nm rms; (c) Four or more axes which can be coordinated simultaneously for ‘contouring control’; and (d) Using any of the following processes: 1. ‘Magnetorheological finishing (MRF)’; 2. ‘Electrorheological finishing (ERF)’; 3. ‘Energetic particle beam finishing’; 4. ‘Inflatable membrane tool finishing’; or 5. ‘Fluid jet finishing’. Technical notes : For the purposes of the items above: 1. ‘MRF’ is a material removal process using an abrasive magnetic fluid whose viscosity is controlled by a magnetic field. 2. ‘ERF’ is a removal process using an abrasive fluid whose viscosity is controlled by an electric field. 3. ‘Energetic particle beam finishing’ uses Reactive Atom Plasmas (RAP) or ion beams to selectively remove material. 4. ‘Inflatable membrane tool finishing’ is a process that uses a pressurized membrane that deforms to contact the workpiece over a small area 5. ‘Fluid jet finishing’ makes use of a fluid stream for material removal

    Authority: EU
    Prohibited Supply To: KP
    Program: KP
    EU Code: IX.A2.003
    Code: 2B002
    Good

    Numerically controlled optical finishing machine tools equipped for selective material removal to produce non-spherical optical surfaces having all of the following characteristics: (a) Finishing the form to less (better) than 1,0 μm; (b) Finishing to a roughness less (better) than 100 nm rms; (c) Four or more axes which can be coordinated simultaneously for ‘contouring control’; and (d) Using any of the following processes: 1. ‘Magnetorheological finishing (MRF)’; 2. ‘Electrorheological finishing (ERF)’; 3. ‘Energetic particle beam finishing’; 4. ‘Inflatable membrane tool finishing’; or 5. ‘Fluid jet finishing’. Technical notes : For the purposes of the items above: 1. ‘MRF’ is a material removal process using an abrasive magnetic fluid whose viscosity is controlled by a magnetic field. 2. ‘ERF’ is a removal process using an abrasive fluid whose viscosity is controlled by an electric field. 3. ‘Energetic particle beam finishing’ uses Reactive Atom Plasmas (RAP) or ion beams to selectively remove material. 4. ‘Inflatable membrane tool finishing’ is a process that uses a pressurized membrane that deforms to contact the workpiece over a small area 5. ‘Fluid jet finishing’ makes use of a fluid stream for material removal

    Authority: EU
    Prohibited Supply To: KP
    Program: KP
    EU Code: IX.A2.003
    Code: 2B002
  • Good

    Machine tools and any combination thereof, for removing (or cutting) metals, ceramics or ‘composites’, which, according to the manufacturer's technical specification, can be equipped with electronic devices for ‘numerical control’: (a) Machine tools for grinding having any of the following: 1. Three or more axes which can be coordinated simultaneously for ‘contouring control’ and a ‘unidirectional positioning repeatability’ equal to or less (better) than 1,1 μm along one or more linear axis; or 2. Five or more axes which can be coordinated simultaneously for ‘contouring control’; (b) Machine tools for removing metals, ceramics or ‘composites’, having all of the following: 1. Removing material by means of any of the following: a. Water or other liquid jets, including those employing abrasive additives; b. Electron beam; or c. ‘Laser’ beam; and 2. At least two rotary axes that can be coordinated simultaneously for ‘contouring control’.

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A2.002
    Code: 2B001
    Good

    Machine tools and any combination thereof, for removing (or cutting) metals, ceramics or ‘composites’, which, according to the manufacturer's technical specification, can be equipped with electronic devices for ‘numerical control’: (a) Machine tools for grinding having any of the following: 1. Three or more axes which can be coordinated simultaneously for ‘contouring control’ and a ‘unidirectional positioning repeatability’ equal to or less (better) than 1,1 μm along one or more linear axis; or 2. Five or more axes which can be coordinated simultaneously for ‘contouring control’; (b) Machine tools for removing metals, ceramics or ‘composites’, having all of the following: 1. Removing material by means of any of the following: a. Water or other liquid jets, including those employing abrasive additives; b. Electron beam; or c. ‘Laser’ beam; and 2. At least two rotary axes that can be coordinated simultaneously for ‘contouring control’.

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A2.002
    Code: 2B001
  • Good

    Anti-friction bearings and bearing systems, as follows, and components therefore: Note : This category does not apply to balls with tolerances specified by the manufacturer in accordance with ISO 3290 as grade 5 or worse. (a) Ball bearings and solid roller bearings, having all tolerances specified by the manufacturer in accordance with ISO 492 Tolerance Class 4 (or national equivalents) or better, and having both ‘rings’ and ‘rolling elements’, made from monel or beryllium; Technical notes: 1. ‘Ring’ —annular part of a radial rolling bearing incorporating one or more raceways (ISO 5593:1997). 2. ‘Rolling element’ —ball or roller which rolls between raceways (ISO 5593:1997). (b) Active magnetic bearing systems using any of the following: 1. Materials with flux densities of 2,0 T or greater and yield strengths greater than 414 MPa; 2. All-electromagnetic three-dimensional homopolar bias designs for actuators; or 3. High-temperature (450 K (177 °C) and above) position sensors.

    Authority: EU
    Prohibited Supply To: KP
    Program: KP
    EU Code: IX.A2.001
    Code: 2A001
    Good

    Anti-friction bearings and bearing systems, as follows, and components therefore: Note : This category does not apply to balls with tolerances specified by the manufacturer in accordance with ISO 3290 as grade 5 or worse. (a) Ball bearings and solid roller bearings, having all tolerances specified by the manufacturer in accordance with ISO 492 Tolerance Class 4 (or national equivalents) or better, and having both ‘rings’ and ‘rolling elements’, made from monel or beryllium; Technical notes: 1. ‘Ring’ —annular part of a radial rolling bearing incorporating one or more raceways (ISO 5593:1997). 2. ‘Rolling element’ —ball or roller which rolls between raceways (ISO 5593:1997). (b) Active magnetic bearing systems using any of the following: 1. Materials with flux densities of 2,0 T or greater and yield strengths greater than 414 MPa; 2. All-electromagnetic three-dimensional homopolar bias designs for actuators; or 3. High-temperature (450 K (177 °C) and above) position sensors.

    Authority: EU
    Prohibited Supply To: KP
    Program: KP
    EU Code: IX.A2.001
    Code: 2A001
  • Good

    ‘Fibrous or filamentary materials’, as follows: (a) Organic ‘fibrous or filamentary materials’, having all of the following: 1. ‘Specific modulus’ exceeding 12,7 × 10 6 m; and 2. ‘Specific tensile strength’ exceeding 23,5 × 10 4 m; Note : This item does not apply to polyethylene. (b) Carbon ‘fibrous or filamentary materials’, having all of the following: 1. ‘Specific modulus’ exceeding 14,65 × 10 6 m; and 2. ‘Specific tensile strength’ exceeding 26,82 × 10 4 m; (c) Inorganic ‘fibrous or filamentary materials’, having all of the following: 1. ‘Specific modulus’ exceeding 2,54 × 10 6 m; and 2. Melting, softening, decomposition or sublimation point exceeding 1 922 K (1 649 °C) in an inert environment.

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A1.011
    Code: 1C010
    Good

    ‘Fibrous or filamentary materials’, as follows: (a) Organic ‘fibrous or filamentary materials’, having all of the following: 1. ‘Specific modulus’ exceeding 12,7 × 10 6 m; and 2. ‘Specific tensile strength’ exceeding 23,5 × 10 4 m; Note : This item does not apply to polyethylene. (b) Carbon ‘fibrous or filamentary materials’, having all of the following: 1. ‘Specific modulus’ exceeding 14,65 × 10 6 m; and 2. ‘Specific tensile strength’ exceeding 26,82 × 10 4 m; (c) Inorganic ‘fibrous or filamentary materials’, having all of the following: 1. ‘Specific modulus’ exceeding 2,54 × 10 6 m; and 2. Melting, softening, decomposition or sublimation point exceeding 1 922 K (1 649 °C) in an inert environment.

    Authority: EU
    Prohibited Supply To: IRKP
    Program: KP
    EU Code: IX.A1.011
    Code: 1C010
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