Search Sanctioned Goods & HS Codes

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Systems specially designed or modified for the automated control of the motion of submersible vehicles specified above, using navigation data, having closed loop servo-controls and having any of the following: 1. Enabling a vehicle to move within 10 m of a predetermined point in the water column; 2. Maintaining the position of the vehicle within 10 m of a predetermined point in the water column; or 3. Maintaining the position of the vehicle within 10 m while following a cable on or under the seabed;
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A8.002
Code: 8A002
Systems specially designed or modified for the automated control of the motion of submersible vehicles specified above, using navigation data, having closed loop servo-controls and having any of the following: 1. Enabling a vehicle to move within 10 m of a predetermined point in the water column; 2. Maintaining the position of the vehicle within 10 m of a predetermined point in the water column; or 3. Maintaining the position of the vehicle within 10 m while following a cable on or under the seabed;
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A8.002
Code: 8A002
Systems, equipment and components, specially designed or modified for submersible vehicles and designed to operate at depths exceeding 1 000 m, as follows: 1. Pressure housings or pressure hulls with a maximum inside chamber diameter exceeding 1,5 m; 2. Direct current propulsion motors or thrusters; 3. Umbilical cables, and connectors therefor, using optical fibre and having synthetic strength members; 4. Components manufactured from material as follows: ‘Syntactic foam’ designed for underwater use and having all of the following: a. Designed for marine depths exceeding 1 000 m; and b. A density less than 561 kg/m 3 ;
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A8.001
Code: 8A002
Systems, equipment and components, specially designed or modified for submersible vehicles and designed to operate at depths exceeding 1 000 m, as follows: 1. Pressure housings or pressure hulls with a maximum inside chamber diameter exceeding 1,5 m; 2. Direct current propulsion motors or thrusters; 3. Umbilical cables, and connectors therefor, using optical fibre and having synthetic strength members; 4. Components manufactured from material as follows: ‘Syntactic foam’ designed for underwater use and having all of the following: a. Designed for marine depths exceeding 1 000 m; and b. A density less than 561 kg/m 3 ;
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A8.001
Code: 8A002
Glass, including fused silica, phosphate glass, fluorophosphate glass, zirconium fluoride (ZrF 4 ) (CAS 7783-64-4) and hafnium fluoride (HfF 4 ) (CAS 13709-52-9) and having all of the following: 1. A hydroxyl ion (OH – ) concentration of less than 5 ppm; 2. Integrated metallic purity levels of less than 1 ppm; and 3. High homogeneity (index of refraction variance) less than 5 × 10 – 6 ; (e) Synthetically produced diamond material with an absorption of less than 10 – 5 cm – 1 for wavelengths exceeding 200 nm but not exceeding 14 000 nm.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A6.026
Code: 6C004
Glass, including fused silica, phosphate glass, fluorophosphate glass, zirconium fluoride (ZrF 4 ) (CAS 7783-64-4) and hafnium fluoride (HfF 4 ) (CAS 13709-52-9) and having all of the following: 1. A hydroxyl ion (OH – ) concentration of less than 5 ppm; 2. Integrated metallic purity levels of less than 1 ppm; and 3. High homogeneity (index of refraction variance) less than 5 × 10 – 6 ; (e) Synthetically produced diamond material with an absorption of less than 10 – 5 cm – 1 for wavelengths exceeding 200 nm but not exceeding 14 000 nm.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A6.026
Code: 6C004
‘Substrate blanks’ of silicon carbide or beryllium beryllium (Be/Be) deposited materials, exceeding 300 mm in diameter or major axis length;
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A6.025
Code: 6C004
‘Substrate blanks’ of silicon carbide or beryllium beryllium (Be/Be) deposited materials, exceeding 300 mm in diameter or major axis length;
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A6.025
Code: 6C004
Optical materials, as follows: (a) Zinc selenide (ZnSe) and zinc sulphide (ZnS) ‘substrate blanks’, produced by the chemical vapour deposition process and having any of the following: 1. A volume greater than 100 cm 3 ; or 2. A diameter greater than 80 mm and a thickness of 20 mm or more; (b) Electro-optic materials and non-linear optical materials, as follows: 1. Potassium titanyl arsenate (KTA) (CAS 59400-80-5); 2. Silver gallium selenide (AgGaSe 2 , also known as AGSE) (CAS 12002-67-4); 3. Thallium arsenic selenide (Tl 3 AsSe 3 , also known as TAS) (CAS 16142-89-5); 4. Zinc germanium phosphide (ZnGeP 2 , also known as ZGP, zinc germanium biphosphide or zinc germanium diphosphide); or 5. Gallium selenide (GaSe) (CAS 12024-11-2);
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A6.024
Code: 6C004
Optical materials, as follows: (a) Zinc selenide (ZnSe) and zinc sulphide (ZnS) ‘substrate blanks’, produced by the chemical vapour deposition process and having any of the following: 1. A volume greater than 100 cm 3 ; or 2. A diameter greater than 80 mm and a thickness of 20 mm or more; (b) Electro-optic materials and non-linear optical materials, as follows: 1. Potassium titanyl arsenate (KTA) (CAS 59400-80-5); 2. Silver gallium selenide (AgGaSe 2 , also known as AGSE) (CAS 12002-67-4); 3. Thallium arsenic selenide (Tl 3 AsSe 3 , also known as TAS) (CAS 16142-89-5); 4. Zinc germanium phosphide (ZnGeP 2 , also known as ZGP, zinc germanium biphosphide or zinc germanium diphosphide); or 5. Gallium selenide (GaSe) (CAS 12024-11-2);
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A6.024
Code: 6C004
Components, as follows: 1. Mirrors cooled either by ‘active cooling’ or by heat pipe cooling; Technical note: ‘Active cooling’ is a cooling technique for optical components using flowing fluids within the subsurface (nominally less than 1 mm below the optical surface) of the optical component to remove heat from the optic. 2. Optical mirrors or transmissive or partially transmissive optical or electro-optical components, other than fused tapered fibre combiners and Multi-Layer Dielectric gratings (MLDs), specially designed for use with specified ‘lasers’; 3. Fibre ‘laser’ components: a. Multimode to multimode fused tapered fibre combiners having all of the following: 1. An insertion loss better (less) than or equal to 0,3 dB maintained at a rated total average or CW output power (excluding output power transmitted through the single mode core if present) exceeding 1 000 W; and 2. Number of input fibres equal to or greater than 3; b. Single-mode to multimode fused tapered fibre combiners having all of the following: 1. An insertion loss better (less) than 0,5 dB maintained at a rated total average or CW output power exceeding 4 600 W; 2. Number of input fibres equal to or greater than 3; and 3. Having any of the following: a. A Beam Parameter Product (BPP) measured at the output not exceeding 1,5 mm mrad for a number of input fibres less than or equal to 5; or b. A BPP measured at the output not exceeding 2,5 mm mrad for a number of input fibres greater than 5; c. MLDs having all of the following: 1. Designed for spectral or coherent beam combination of 5 or more fibre ‘lasers’; and 2. CW ‘Laser’ Induced Damage Threshold (LIDT) greater than or equal to 10 kW/cm 2 .
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.017
Code: 6A005
Components, as follows: 1. Mirrors cooled either by ‘active cooling’ or by heat pipe cooling; Technical note: ‘Active cooling’ is a cooling technique for optical components using flowing fluids within the subsurface (nominally less than 1 mm below the optical surface) of the optical component to remove heat from the optic. 2. Optical mirrors or transmissive or partially transmissive optical or electro-optical components, other than fused tapered fibre combiners and Multi-Layer Dielectric gratings (MLDs), specially designed for use with specified ‘lasers’; 3. Fibre ‘laser’ components: a. Multimode to multimode fused tapered fibre combiners having all of the following: 1. An insertion loss better (less) than or equal to 0,3 dB maintained at a rated total average or CW output power (excluding output power transmitted through the single mode core if present) exceeding 1 000 W; and 2. Number of input fibres equal to or greater than 3; b. Single-mode to multimode fused tapered fibre combiners having all of the following: 1. An insertion loss better (less) than 0,5 dB maintained at a rated total average or CW output power exceeding 4 600 W; 2. Number of input fibres equal to or greater than 3; and 3. Having any of the following: a. A Beam Parameter Product (BPP) measured at the output not exceeding 1,5 mm mrad for a number of input fibres less than or equal to 5; or b. A BPP measured at the output not exceeding 2,5 mm mrad for a number of input fibres greater than 5; c. MLDs having all of the following: 1. Designed for spectral or coherent beam combination of 5 or more fibre ‘lasers’; and 2. CW ‘Laser’ Induced Damage Threshold (LIDT) greater than or equal to 10 kW/cm 2 .
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.017
Code: 6A005
‘Chemical lasers’, as follows: a. Hydrogen Fluoride (HF) ‘lasers’; b. Deuterium Fluoride (DF) ‘lasers’; c. ‘Transfer lasers’, as follows: 1. Oxygen Iodine (O 2 -I) ‘lasers’; 2. Deuterium Fluoride-Carbon dioxide (DF-CO 2 ) ‘lasers’; 3. ‘Non-repetitive pulsed’ Nd: glass ‘lasers’ having any of the following: a. ‘Pulse duration’ not exceeding 1 μs and output energy exceeding 50 J per pulse; or b. ‘Pulse duration’ exceeding 1 μs and output energy exceeding 100 J per pulse;
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.016
Code: 6A005
‘Chemical lasers’, as follows: a. Hydrogen Fluoride (HF) ‘lasers’; b. Deuterium Fluoride (DF) ‘lasers’; c. ‘Transfer lasers’, as follows: 1. Oxygen Iodine (O 2 -I) ‘lasers’; 2. Deuterium Fluoride-Carbon dioxide (DF-CO 2 ) ‘lasers’; 3. ‘Non-repetitive pulsed’ Nd: glass ‘lasers’ having any of the following: a. ‘Pulse duration’ not exceeding 1 μs and output energy exceeding 50 J per pulse; or b. ‘Pulse duration’ exceeding 1 μs and output energy exceeding 100 J per pulse;
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.016
Code: 6A005
Other semiconductor ‘lasers’, as follows: Notes: 1. Includes semiconductor ‘lasers’ having optical output connectors (e.g., fibre-optic pigtails). 2. The status of semiconductor ‘lasers’ specially designed for other equipment is determined by the status of the other equipment. a. Individual single-transverse mode semiconductor ‘lasers’ having any of the following: 1. Wavelength equal to or less than 1 510 nm and average or CW output power, exceeding 1,5 W; or 2. Wavelength greater than 1 510 nm and average or CW output power, exceeding 500 mW; b. Individual, multiple-transverse mode semiconductor ‘lasers’ having any of the following: 1. Wavelength of less than 1 400 nm and average or CW output power, exceeding 15 W; 2. Wavelength equal to or greater than 1 400 nm and less than 1 900 nm and average or CW output power, exceeding 2,5 W; or 3. Wavelength equal to or greater than 1 900 nm and average or CW output power, exceeding 1 W; c. Individual semiconductor ‘laser’‘bars’ having any of the following: 1. Wavelength of less than 1 400 nm and average or CW output power, exceeding 100 W; 2. Wavelength equal to or greater than 1 400 nm and less than 1 900 nm and average or CW output power, exceeding 25 W; or 3. Wavelength equal to or greater than 1 900 nm and average or CW output power, exceeding 10 W; d. Semiconductor ‘laser’‘stacked arrays’ (two-dimensional arrays) having any of the following: 1. Wavelength less than 1 400 nm and having any of the following: a. Average or CW total output power less than 3 kW and having average or CW output ‘power density’ greater than 500 W/cm 2 ; b. Average or CW total output power equal to or exceeding 3 kW but less than or equal to 5 kW, and having average or CW output ‘power density’ greater than 350W/cm 2 ; c. Average or CW total output power exceeding 5 kW; d. Peak pulsed ‘power density’ exceeding 2 500 W/cm 2 ; or Note : Item d. does not apply to epitaxially fabricated monolithic devices. e. Spatially coherent average or CW total output power, greater than 150 W; 2. Wavelength greater than or equal to 1 400 nm but less than 1 900 nm, and having any of the following: a. Average or CW total output power less than 250 W and average or CW output ‘power density’ greater than 150 W/cm 2 ; b. Average or CW total output power equal to or exceeding 250 W but less than or equal to 500 W, and having average or CW output ‘power density’ greater than 50W/cm 2 ; c. Average or CW total output power exceeding 500 W; d. Peak pulsed ‘power density’ exceeding 500 W/cm 2 ; or Note : Item d. does not apply to epitaxially fabricated monolithic devices. e. Spatially coherent average or CW total output power, exceeding 15 W; 3. Wavelength greater than or equal to 1 900 nm and having any of the following: a. Average or CW output ‘power density’ greater than 50 W/cm 2 ; b. Average or CW output power greater than 10 W; or c. Spatially coherent average or CW total output power, exceeding 1,5W; or 4. At least one ‘laser’‘bar’ specified above; Technical note: For the purposes of this category ‘power density’ means the total ‘laser’ output power divided by the emitter surface area of the ‘stacked array’.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.015
Code: 6A005
Other semiconductor ‘lasers’, as follows: Notes: 1. Includes semiconductor ‘lasers’ having optical output connectors (e.g., fibre-optic pigtails). 2. The status of semiconductor ‘lasers’ specially designed for other equipment is determined by the status of the other equipment. a. Individual single-transverse mode semiconductor ‘lasers’ having any of the following: 1. Wavelength equal to or less than 1 510 nm and average or CW output power, exceeding 1,5 W; or 2. Wavelength greater than 1 510 nm and average or CW output power, exceeding 500 mW; b. Individual, multiple-transverse mode semiconductor ‘lasers’ having any of the following: 1. Wavelength of less than 1 400 nm and average or CW output power, exceeding 15 W; 2. Wavelength equal to or greater than 1 400 nm and less than 1 900 nm and average or CW output power, exceeding 2,5 W; or 3. Wavelength equal to or greater than 1 900 nm and average or CW output power, exceeding 1 W; c. Individual semiconductor ‘laser’‘bars’ having any of the following: 1. Wavelength of less than 1 400 nm and average or CW output power, exceeding 100 W; 2. Wavelength equal to or greater than 1 400 nm and less than 1 900 nm and average or CW output power, exceeding 25 W; or 3. Wavelength equal to or greater than 1 900 nm and average or CW output power, exceeding 10 W; d. Semiconductor ‘laser’‘stacked arrays’ (two-dimensional arrays) having any of the following: 1. Wavelength less than 1 400 nm and having any of the following: a. Average or CW total output power less than 3 kW and having average or CW output ‘power density’ greater than 500 W/cm 2 ; b. Average or CW total output power equal to or exceeding 3 kW but less than or equal to 5 kW, and having average or CW output ‘power density’ greater than 350W/cm 2 ; c. Average or CW total output power exceeding 5 kW; d. Peak pulsed ‘power density’ exceeding 2 500 W/cm 2 ; or Note : Item d. does not apply to epitaxially fabricated monolithic devices. e. Spatially coherent average or CW total output power, greater than 150 W; 2. Wavelength greater than or equal to 1 400 nm but less than 1 900 nm, and having any of the following: a. Average or CW total output power less than 250 W and average or CW output ‘power density’ greater than 150 W/cm 2 ; b. Average or CW total output power equal to or exceeding 250 W but less than or equal to 500 W, and having average or CW output ‘power density’ greater than 50W/cm 2 ; c. Average or CW total output power exceeding 500 W; d. Peak pulsed ‘power density’ exceeding 500 W/cm 2 ; or Note : Item d. does not apply to epitaxially fabricated monolithic devices. e. Spatially coherent average or CW total output power, exceeding 15 W; 3. Wavelength greater than or equal to 1 900 nm and having any of the following: a. Average or CW output ‘power density’ greater than 50 W/cm 2 ; b. Average or CW output power greater than 10 W; or c. Spatially coherent average or CW total output power, exceeding 1,5W; or 4. At least one ‘laser’‘bar’ specified above; Technical note: For the purposes of this category ‘power density’ means the total ‘laser’ output power divided by the emitter surface area of the ‘stacked array’.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.015
Code: 6A005
‘Tunable’‘lasers’ having any of the following: 1. Output wavelength less than 600 nm and any of the following: a. Output energy exceeding 50 mJ per pulse and ‘peak power’ exceeding 1 W; or b. Average or CW output power exceeding 1 W; Note : Item 1. above does not apply to dye ‘lasers’ or other liquid ‘lasers’, having a multimode output and a wavelength of 150 nm or more but not exceeding 600 nm and all of the following: 1. Output energy less than 1,5 J per pulse or a ‘peak power’ less than 20 W; and 2. Average or CW output power less than 20 W. 2. Output wavelength of 600 nm or more but not exceeding 1 400 nm, and any of the following: a. Output energy exceeding 1 J per pulse and ‘peak power’ exceeding 20 W; or b. Average or CW output power exceeding 20 W; or 3. Output wavelength exceeding 1 400 nm and any of the following: a. Output energy exceeding 50 mJ per pulse and ‘peak power’ exceeding 1 W; or b. Average or CW output power exceeding 1 W;
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.014
Code: 6A005
‘Tunable’‘lasers’ having any of the following: 1. Output wavelength less than 600 nm and any of the following: a. Output energy exceeding 50 mJ per pulse and ‘peak power’ exceeding 1 W; or b. Average or CW output power exceeding 1 W; Note : Item 1. above does not apply to dye ‘lasers’ or other liquid ‘lasers’, having a multimode output and a wavelength of 150 nm or more but not exceeding 600 nm and all of the following: 1. Output energy less than 1,5 J per pulse or a ‘peak power’ less than 20 W; and 2. Average or CW output power less than 20 W. 2. Output wavelength of 600 nm or more but not exceeding 1 400 nm, and any of the following: a. Output energy exceeding 1 J per pulse and ‘peak power’ exceeding 20 W; or b. Average or CW output power exceeding 20 W; or 3. Output wavelength exceeding 1 400 nm and any of the following: a. Output energy exceeding 50 mJ per pulse and ‘peak power’ exceeding 1 W; or b. Average or CW output power exceeding 1 W;
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.014
Code: 6A005
Non-‘tunable’ continuous-wave ‘(CW) lasers’ having any of the following: 1. Output wavelength less than 150 nm and output power exceeding 1 W; 2. Output wavelength of 150 nm or more but not exceeding 510 nm and output power exceeding 30 W; Note : Item 2 above does not apply to Argon ‘lasers’ having an output power equal to or less than 50 W. 3. Output wavelength exceeding 510 nm but not exceeding 540 nm and any of the following: a. Single transverse mode output and output power exceeding 50 W; or b. Multiple transverse mode output and output power exceeding 150 W; 4. Output wavelength exceeding 540 nm but not exceeding 800 nm and output power exceeding 30 W; 5. Output wavelength exceeding 800 nm but not exceeding 975 nm and any of the following: a. Single transverse mode output and output power exceeding 50 W; or b. Multiple transverse mode output and output power exceeding 80 W; 6. Output wavelength exceeding 975 nm but not exceeding 1 150 nm and any of the following: a. Single transverse mode and output power exceeding 500 W; or b. Multiple transverse mode output and any of the following: 1. ‘Wall-plug efficiency’ exceeding 18 % and output power exceeding 500 W; or 2. Output power exceeding 2 kW; Notes: 1. Item b. above does not apply to multiple transverse mode, industrial ‘lasers’ with output power exceeding 2 kW and not exceeding 6 kW with a total mass greater than 1 200 kg. For the purposes of this note, total mass includes all components required to operate the ‘laser’, e.g., ‘laser’, power supply, heat exchanger, but excludes external optics for beam conditioning and/or delivery. 2. Item b. above does not apply to multiple transverse mode, industrial ‘lasers’ having any of the following: (a) Output power exceeding 500 W but not exceeding 1 kW and having all of the following: 1. Beam Parameter Product (BPP) exceeding 0,7 mm · mrad; and 2. ‘Brightness’ not exceeding 1 024 W/(mm · mrad) 2 ; (b) Output power exceeding 1 kW but not exceeding 1,6 kW and having a BPP exceeding 1,25 mm · mrad; (c) Output power exceeding 1,6 kW but not exceeding 2,5 kW and having a BPP exceeding 1,7 mm · mrad; (d) Output power exceeding 2,5 kW but not exceeding 3,3 kW and having a BPP exceeding 2,5 mm · mrad; (e) Output power exceeding 3,3 kW but not exceeding 4 kW and having a BPP exceeding 3,5 mm · mrad; (f) Output power exceeding 4 kW but not exceeding 5 kW and having a BPP exceeding 5 mm · mrad; (g) Output power exceeding 5 kW but not exceeding 6 kW and having a BPP exceeding 7,2 mm · mrad; (h) Output power exceeding 6 kW but not exceeding 8 kW and having a BPP exceeding 12 mm · mrad; or (i) Output power exceeding 8 kW but not exceeding 10 kW and having a BPP exceeding 24 mm · mrad; Technical note: For the purposes of note 2.a., ‘brightness’ is defined as the output power of the ‘laser’ divided by the squared Beam Parameter Product (BPP), i.e., (output power)/BPP 2 .
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.013
Code: 6A005
Non-‘tunable’ continuous-wave ‘(CW) lasers’ having any of the following: 1. Output wavelength less than 150 nm and output power exceeding 1 W; 2. Output wavelength of 150 nm or more but not exceeding 510 nm and output power exceeding 30 W; Note : Item 2 above does not apply to Argon ‘lasers’ having an output power equal to or less than 50 W. 3. Output wavelength exceeding 510 nm but not exceeding 540 nm and any of the following: a. Single transverse mode output and output power exceeding 50 W; or b. Multiple transverse mode output and output power exceeding 150 W; 4. Output wavelength exceeding 540 nm but not exceeding 800 nm and output power exceeding 30 W; 5. Output wavelength exceeding 800 nm but not exceeding 975 nm and any of the following: a. Single transverse mode output and output power exceeding 50 W; or b. Multiple transverse mode output and output power exceeding 80 W; 6. Output wavelength exceeding 975 nm but not exceeding 1 150 nm and any of the following: a. Single transverse mode and output power exceeding 500 W; or b. Multiple transverse mode output and any of the following: 1. ‘Wall-plug efficiency’ exceeding 18 % and output power exceeding 500 W; or 2. Output power exceeding 2 kW; Notes: 1. Item b. above does not apply to multiple transverse mode, industrial ‘lasers’ with output power exceeding 2 kW and not exceeding 6 kW with a total mass greater than 1 200 kg. For the purposes of this note, total mass includes all components required to operate the ‘laser’, e.g., ‘laser’, power supply, heat exchanger, but excludes external optics for beam conditioning and/or delivery. 2. Item b. above does not apply to multiple transverse mode, industrial ‘lasers’ having any of the following: (a) Output power exceeding 500 W but not exceeding 1 kW and having all of the following: 1. Beam Parameter Product (BPP) exceeding 0,7 mm · mrad; and 2. ‘Brightness’ not exceeding 1 024 W/(mm · mrad) 2 ; (b) Output power exceeding 1 kW but not exceeding 1,6 kW and having a BPP exceeding 1,25 mm · mrad; (c) Output power exceeding 1,6 kW but not exceeding 2,5 kW and having a BPP exceeding 1,7 mm · mrad; (d) Output power exceeding 2,5 kW but not exceeding 3,3 kW and having a BPP exceeding 2,5 mm · mrad; (e) Output power exceeding 3,3 kW but not exceeding 4 kW and having a BPP exceeding 3,5 mm · mrad; (f) Output power exceeding 4 kW but not exceeding 5 kW and having a BPP exceeding 5 mm · mrad; (g) Output power exceeding 5 kW but not exceeding 6 kW and having a BPP exceeding 7,2 mm · mrad; (h) Output power exceeding 6 kW but not exceeding 8 kW and having a BPP exceeding 12 mm · mrad; or (i) Output power exceeding 8 kW but not exceeding 10 kW and having a BPP exceeding 24 mm · mrad; Technical note: For the purposes of note 2.a., ‘brightness’ is defined as the output power of the ‘laser’ divided by the squared Beam Parameter Product (BPP), i.e., (output power)/BPP 2 .
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.013
Code: 6A005
Optical components made from zinc selenide (ZnSe) or zinc sulphide (ZnS) with transmission in the wavelength range exceeding 3 000 nm but not exceeding 25 000 nm and having any of the following: 1. Exceeding 100 cm 3 in volume; or 2. Exceeding 80 mm in diameter or length of major axis and 20 mm in thickness (depth); (c) ‘Space-qualified’ components for optical systems, as follows: 1. Components lightweighted to less than 20 % ‘equivalent density’ compared with a solid blank of the same aperture and thickness; 2. Raw substrates, processed substrates having surface coatings (single-layer or multi-layer, metallic or dielectric, conducting, semiconducting or insulating) or having protective films; 3. Segments or assemblies of mirrors designed to be assembled in space into an optical system with a collecting aperture equivalent to or larger than a single optic 1 m in diameter; 4. Components manufactured from ‘composite’ materials having a coefficient of linear thermal expansion equal to or less than 5 × 10 – 6 in any coordinate direction.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.012
Code: 6A004
Optical components made from zinc selenide (ZnSe) or zinc sulphide (ZnS) with transmission in the wavelength range exceeding 3 000 nm but not exceeding 25 000 nm and having any of the following: 1. Exceeding 100 cm 3 in volume; or 2. Exceeding 80 mm in diameter or length of major axis and 20 mm in thickness (depth); (c) ‘Space-qualified’ components for optical systems, as follows: 1. Components lightweighted to less than 20 % ‘equivalent density’ compared with a solid blank of the same aperture and thickness; 2. Raw substrates, processed substrates having surface coatings (single-layer or multi-layer, metallic or dielectric, conducting, semiconducting or insulating) or having protective films; 3. Segments or assemblies of mirrors designed to be assembled in space into an optical system with a collecting aperture equivalent to or larger than a single optic 1 m in diameter; 4. Components manufactured from ‘composite’ materials having a coefficient of linear thermal expansion equal to or less than 5 × 10 – 6 in any coordinate direction.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.012
Code: 6A004
Mirrors specially designed for beam steering mirror stages with a flatness of λ/10 or better (λ is equal to 633 nm) and having any of the following: a. Diameter or major axis length greater than or equal to 100 mm; or b. Having all of the following: 1. Diameter or major axis length greater than 50 mm but less than 100 mm; and 2. A Laser Induced Damage Threshold (LIDT) being any of the following: a. Greater than 10 kW/cm 2 using a ‘CW laser’; or b. Greater than 20 J/cm 2 using 20 ns ‘laser’ pulses at 20 Hz repetition rate;
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.011
Code: 6A004
Mirrors specially designed for beam steering mirror stages with a flatness of λ/10 or better (λ is equal to 633 nm) and having any of the following: a. Diameter or major axis length greater than or equal to 100 mm; or b. Having all of the following: 1. Diameter or major axis length greater than 50 mm but less than 100 mm; and 2. A Laser Induced Damage Threshold (LIDT) being any of the following: a. Greater than 10 kW/cm 2 using a ‘CW laser’; or b. Greater than 20 J/cm 2 using 20 ns ‘laser’ pulses at 20 Hz repetition rate;
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.011
Code: 6A004
Optical mirrors (reflectors), as follows: 1. ‘Deformable mirrors’ having an active optical aperture greater than 10 mm and having any of the following, and specially designed components therefor: a. Having all the following: 1. A mechanical resonant frequency of 750 Hz or more; and 2. More than 200 actuators; or b. A Laser Induced Damage Threshold (LIDT) being any of the following: 1. Greater than 1 kW/cm 2 using a ‘CW laser’; or 2. Greater than 2 J/cm 2 using 20 ns ‘laser’ pulses at 20 Hz repetition rate; 2. Lightweight monolithic mirrors having an average ‘equivalent density’ of less than 30 kg/m 2 and a total mass exceeding 10 kg; 3. Lightweight ‘composite’ or foam mirror structures having an average ‘equivalent density’ of less than 30 kg/m 2 and a total mass exceeding 2 kg; Note : Items 2 and 3 above do not apply to mirrors specially designed to direct solar radiation for terrestrial heliostat installations.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.010
Code: 6A004
Optical mirrors (reflectors), as follows: 1. ‘Deformable mirrors’ having an active optical aperture greater than 10 mm and having any of the following, and specially designed components therefor: a. Having all the following: 1. A mechanical resonant frequency of 750 Hz or more; and 2. More than 200 actuators; or b. A Laser Induced Damage Threshold (LIDT) being any of the following: 1. Greater than 1 kW/cm 2 using a ‘CW laser’; or 2. Greater than 2 J/cm 2 using 20 ns ‘laser’ pulses at 20 Hz repetition rate; 2. Lightweight monolithic mirrors having an average ‘equivalent density’ of less than 30 kg/m 2 and a total mass exceeding 10 kg; 3. Lightweight ‘composite’ or foam mirror structures having an average ‘equivalent density’ of less than 30 kg/m 2 and a total mass exceeding 2 kg; Note : Items 2 and 3 above do not apply to mirrors specially designed to direct solar radiation for terrestrial heliostat installations.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.010
Code: 6A004
Optical sensing fibres specially fabricated either compositionally or structurally, or modified by coating, to be acoustically, thermally, inertially, electromagnetically or nuclear radiation sensitive.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.003
Code: 6A002
Optical sensing fibres specially fabricated either compositionally or structurally, or modified by coating, to be acoustically, thermally, inertially, electromagnetically or nuclear radiation sensitive.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.003
Code: 6A002
Non-‘space-qualified’ cryocoolers having a cooling source temperature below 218 K (– 55 °C), as follows: (a) Closed cycle type with a specified Mean-Time-To-Failure (MTTF) or Mean-Time-Between-Failures (MTBF), exceeding 2 500 hours; (b) Joule-Thomson (JT) self-regulating minicoolers having bore (outside) diameters of less than 8 mm;
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.002
Code: 6A002
Non-‘space-qualified’ cryocoolers having a cooling source temperature below 218 K (– 55 °C), as follows: (a) Closed cycle type with a specified Mean-Time-To-Failure (MTTF) or Mean-Time-Between-Failures (MTBF), exceeding 2 500 hours; (b) Joule-Thomson (JT) self-regulating minicoolers having bore (outside) diameters of less than 8 mm;
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.002
Code: 6A002
Optical sensors or equipment and components therefor, as follows: (a) Special support components for optical sensors, as follows: 1. ‘Space-qualified’ cryocoolers;
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.001
Code: 6A002
Optical sensors or equipment and components therefor, as follows: (a) Special support components for optical sensors, as follows: 1. ‘Space-qualified’ cryocoolers;
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.001
Code: 6A002
Equipment designed for device processing using direct writing methods; Masks and reticles, designed for integrated circuits.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.038
Code: 3B001
Equipment designed for device processing using direct writing methods; Masks and reticles, designed for integrated circuits.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.038
Code: 3B001
Equipment for the manufacturing of semiconductor devices or materials, as follows and specially designed components and accessories therefor: (a) Equipment designed for ion implantation and having any of the following: 1. Being designed and optimized to operate at a beam energy of 20 keV or more and a beam current of 10 mA or more for hydrogen, deuterium or helium implant; 2. Direct write capability; 3. A beam energy of 65 keV or more and a beam current of 45 mA or more for high-energy oxygen implant into a heated semiconductor material ‘substrate’; or 4. Being designed and optimized to operate at a beam energy of 20 keV or more and a beam current of 10 mA or more for silicon implant into a semiconductor material ‘substrate’ heated to 600 °C or greater; (b) Lithography equipment as follows and imprint lithography equipment capable of producing features of 45 nm or less: 1. Align and expose step and repeat (direct step on wafer) or step and scan (scanner) equipment for wafer processing using photo-optical or X-ray methods and having any of the following: a. A light source wavelength shorter than 193 nm; or b. Capable of producing a pattern with a ‘Minimum Resolvable Feature size’ (MRF) of 45 nm or less; Technical note : The ‘Minimum Resolvable Feature size’ (MRF) is calculated by the following formula: where the K factor = 0,35 (c) Equipment specially designed for mask using deflected focused electron beam, ion beam or ‘laser’ beam;
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.037
Code: 3B001
Equipment for the manufacturing of semiconductor devices or materials, as follows and specially designed components and accessories therefor: (a) Equipment designed for ion implantation and having any of the following: 1. Being designed and optimized to operate at a beam energy of 20 keV or more and a beam current of 10 mA or more for hydrogen, deuterium or helium implant; 2. Direct write capability; 3. A beam energy of 65 keV or more and a beam current of 45 mA or more for high-energy oxygen implant into a heated semiconductor material ‘substrate’; or 4. Being designed and optimized to operate at a beam energy of 20 keV or more and a beam current of 10 mA or more for silicon implant into a semiconductor material ‘substrate’ heated to 600 °C or greater; (b) Lithography equipment as follows and imprint lithography equipment capable of producing features of 45 nm or less: 1. Align and expose step and repeat (direct step on wafer) or step and scan (scanner) equipment for wafer processing using photo-optical or X-ray methods and having any of the following: a. A light source wavelength shorter than 193 nm; or b. Capable of producing a pattern with a ‘Minimum Resolvable Feature size’ (MRF) of 45 nm or less; Technical note : The ‘Minimum Resolvable Feature size’ (MRF) is calculated by the following formula: where the K factor = 0,35 (c) Equipment specially designed for mask using deflected focused electron beam, ion beam or ‘laser’ beam;
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.037
Code: 3B001
Atomic frequency standards being any of the following: 1. ‘Space-qualified’; 2. Non-rubidium and having a long-term stability less (better) than 1 × 10 – 11 /month; or 3. Non-‘space-qualified’ and having all of the following: a. Being a rubidium standard; b. Long-term stability less (better) than 1 × 10 – 11 /month; and c. Total power consumption of less than 1 Watt.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.036
Code: 3A002
Atomic frequency standards being any of the following: 1. ‘Space-qualified’; 2. Non-rubidium and having a long-term stability less (better) than 1 × 10 – 11 /month; or 3. Non-‘space-qualified’ and having all of the following: a. Being a rubidium standard; b. Long-term stability less (better) than 1 × 10 – 11 /month; and c. Total power consumption of less than 1 Watt.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.036
Code: 3A002
Microwave test receivers having all of the following; 1. A maximum operating frequency exceeding 110 GHz; and 2. Being capable of measuring amplitude and phase simultaneously;
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.035
Code: 3A002
Microwave test receivers having all of the following; 1. A maximum operating frequency exceeding 110 GHz; and 2. Being capable of measuring amplitude and phase simultaneously;
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.035
Code: 3A002

Search sanctioned goods across UK and EU export control lists in one place. This tool covers dual-use items, military equipment, and other restricted goods and technologies. Each entry includes the specific goods description, issuing authority, countries subject to import or export restrictions, and the relevant sanctions programme. This helps compliance and trade teams determine whether an item is subject to import or export prohibitions.

Use the filters to narrow results by authority, target state, or sanctions programme. Whether you’re checking a single HS code or reviewing an entire category, the sanctioned goods list is updated as new designations and programme consolidated changes are published.

Goods search

Search results

‘Substrate blanks’ of silicon carbide or beryllium beryllium (Be/Be) deposited materials, exceeding 300 mm in diameter or major axis length;

‘Substrate blanks’ of silicon carbide or beryllium beryllium (Be/Be) deposited materials, exceeding 300 mm in diameter or major axis length;

Optical sensing fibres specially fabricated either compositionally or structurally, or modified by coating, to be acoustically, thermally, inertially, electromagnetically or nuclear radiation sensitive.

Optical sensing fibres specially fabricated either compositionally or structurally, or modified by coating, to be acoustically, thermally, inertially, electromagnetically or nuclear radiation sensitive.

Optical sensors or equipment and components therefor, as follows: (a) Special support components for optical sensors, as follows: 1. ‘Space-qualified’ cryocoolers;

Optical sensors or equipment and components therefor, as follows: (a) Special support components for optical sensors, as follows: 1. ‘Space-qualified’ cryocoolers;

Equipment designed for device processing using direct writing methods; Masks and reticles, designed for integrated circuits.

Equipment designed for device processing using direct writing methods; Masks and reticles, designed for integrated circuits.

Microwave test receivers having all of the following; 1. A maximum operating frequency exceeding 110 GHz; and 2. Being capable of measuring amplitude and phase simultaneously;

Microwave test receivers having all of the following; 1. A maximum operating frequency exceeding 110 GHz; and 2. Being capable of measuring amplitude and phase simultaneously;

Filters

Search results

‘Substrate blanks’ of silicon carbide or beryllium beryllium (Be/Be) deposited materials, exceeding 300 mm in diameter or major axis length;

‘Substrate blanks’ of silicon carbide or beryllium beryllium (Be/Be) deposited materials, exceeding 300 mm in diameter or major axis length;

Optical sensing fibres specially fabricated either compositionally or structurally, or modified by coating, to be acoustically, thermally, inertially, electromagnetically or nuclear radiation sensitive.

Optical sensing fibres specially fabricated either compositionally or structurally, or modified by coating, to be acoustically, thermally, inertially, electromagnetically or nuclear radiation sensitive.

Optical sensors or equipment and components therefor, as follows: (a) Special support components for optical sensors, as follows: 1. ‘Space-qualified’ cryocoolers;

Optical sensors or equipment and components therefor, as follows: (a) Special support components for optical sensors, as follows: 1. ‘Space-qualified’ cryocoolers;

Equipment designed for device processing using direct writing methods; Masks and reticles, designed for integrated circuits.

Equipment designed for device processing using direct writing methods; Masks and reticles, designed for integrated circuits.

Microwave test receivers having all of the following; 1. A maximum operating frequency exceeding 110 GHz; and 2. Being capable of measuring amplitude and phase simultaneously;

Microwave test receivers having all of the following; 1. A maximum operating frequency exceeding 110 GHz; and 2. Being capable of measuring amplitude and phase simultaneously;