Search Sanctioned Goods & HS Codes

10K+ items found

‘Star trackers’ and components therefor, as follows: (a) ‘Star trackers’ with a specified azimuth ‘accuracy’ of equal to or less (better) than 20 seconds of arc throughout the specified lifetime of the equipment; (b) Components specially designed for equipment specified in item (a), as follows: 1. Optical heads or baffles; 2. Data processing units. Technical note: ‘Star trackers’ are also referred to as stellar attitude sensors or gyro-astro compasses.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A7.001
Code: 7A004
‘Star trackers’ and components therefor, as follows: (a) ‘Star trackers’ with a specified azimuth ‘accuracy’ of equal to or less (better) than 20 seconds of arc throughout the specified lifetime of the equipment; (b) Components specially designed for equipment specified in item (a), as follows: 1. Optical heads or baffles; 2. Data processing units. Technical note: ‘Star trackers’ are also referred to as stellar attitude sensors or gyro-astro compasses.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A7.001
Code: 7A004
‘Laser’ materials, as follows: (a) Synthetic crystalline ‘laser’ host material in unfinished form as follows: 1. Titanium doped sapphire; (b) Rare-earth-metal doped double-clad fibres; 1. Nominal ‘laser’ wavelength of 975 nm to 1 150 nm and having all of the following: a. Average core diameter equal to or greater than 25 μm; and b. Core ‘Numerical Aperture’ (‘NA’) less than 0,065; or Note : The item above does not apply to double-clad fibres having an inner glass cladding diameter exceeding 150 μm and not exceeding 300 μm. 2. Nominal ‘laser’ wavelength exceeding 1 530 nm and having all of the following: a. Average core diameter equal to or greater than 20 μm; and b. Core ‘NA’ less than 0,1. Technical notes: 1. For the purposes of the item above, the core ‘Numerical Aperture’ (‘NA’) is measured at the emission wavelengths of the fibre. 2. Item (b) above includes fibres assembled with end caps.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A6.027
Code: 6C005
‘Laser’ materials, as follows: (a) Synthetic crystalline ‘laser’ host material in unfinished form as follows: 1. Titanium doped sapphire; (b) Rare-earth-metal doped double-clad fibres; 1. Nominal ‘laser’ wavelength of 975 nm to 1 150 nm and having all of the following: a. Average core diameter equal to or greater than 25 μm; and b. Core ‘Numerical Aperture’ (‘NA’) less than 0,065; or Note : The item above does not apply to double-clad fibres having an inner glass cladding diameter exceeding 150 μm and not exceeding 300 μm. 2. Nominal ‘laser’ wavelength exceeding 1 530 nm and having all of the following: a. Average core diameter equal to or greater than 20 μm; and b. Core ‘NA’ less than 0,1. Technical notes: 1. For the purposes of the item above, the core ‘Numerical Aperture’ (‘NA’) is measured at the emission wavelengths of the fibre. 2. Item (b) above includes fibres assembled with end caps.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A6.027
Code: 6C005
Optical sensor materials, as follows: (a) Elemental tellurium (Te) of purity levels of 99,9995 % or more; (b) Single crystals (including epitaxial wafers) of any of the following: 1. Cadmium zinc telluride (CdZnTe) with zinc content of less than 6 % by ‘mole fraction’; 2. Cadmium telluride (CdTe) of any purity level; or 3. Mercury cadmium telluride (HgCdTe) of any purity level. Technical note: ‘Mole fraction’ is defined as the ratio of moles of ZnTe to the sum of the moles of CdTe and ZnTe present in the crystal.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A6.023
Code: 6C002
Optical sensor materials, as follows: (a) Elemental tellurium (Te) of purity levels of 99,9995 % or more; (b) Single crystals (including epitaxial wafers) of any of the following: 1. Cadmium zinc telluride (CdZnTe) with zinc content of less than 6 % by ‘mole fraction’; 2. Cadmium telluride (CdTe) of any purity level; or 3. Mercury cadmium telluride (HgCdTe) of any purity level. Technical note: ‘Mole fraction’ is defined as the ratio of moles of ZnTe to the sum of the moles of CdTe and ZnTe present in the crystal.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A6.023
Code: 6C002
Pulse radar cross-section measurement systems having transmit pulse widths of 100 ns or less, and specially designed components therefor.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.022
Code: 6B008
Pulse radar cross-section measurement systems having transmit pulse widths of 100 ns or less, and specially designed components therefor.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.022
Code: 6B008
Equipment to produce, align and calibrate land-based gravity meters with a static ‘accuracy’ of better than 0,1 mGal.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A6.021
Code: 6B007
Equipment to produce, align and calibrate land-based gravity meters with a static ‘accuracy’ of better than 0,1 mGal.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A6.021
Code: 6B007
Optical equipment, as follows: (a) Equipment for measuring absolute reflectance to an ‘accuracy’ of equal to or better than 0,1 % of the reflectance value; (b) Equipment other than optical surface scattering measurement equipment, having an unobscured aperture of more than 10 cm, specially designed for the non-contact optical measurement of a non-planar optical surface figure (profile) to an ‘accuracy’ of 2 nm or less (better) against the required profile. Note : The item above does not apply to microscopes.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A6.020
Code: 6B004
Optical equipment, as follows: (a) Equipment for measuring absolute reflectance to an ‘accuracy’ of equal to or better than 0,1 % of the reflectance value; (b) Equipment other than optical surface scattering measurement equipment, having an unobscured aperture of more than 10 cm, specially designed for the non-contact optical measurement of a non-planar optical surface figure (profile) to an ‘accuracy’ of 2 nm or less (better) against the required profile. Note : The item above does not apply to microscopes.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A6.020
Code: 6B004
1. Radar systems, equipment and assemblies, having any of the following, and specially designed components therefor: Note : This section does not apply to: — Secondary Surveillance Radar (SSR); — Civil Automotive Radar; — Displays or monitors used for Air Traffic Control (ATC); — Meteorological (weather) Radar; — Precision Approach Radar (PAR) equipment conforming to International Civil Aviation Organization (ICAO) standards and employing electronically steerable linear (one-dimensional) arrays or mechanically positioned passive antennae. (a) Operating at frequencies from 40 GHz to 230 GHz and having any of the following: 1. An average output power exceeding 100 mW; or 2. Locating ‘accuracy’ of 1 m or less (better) in range and 0,2 degree or less (better) in azimuth; (b) A tunable bandwidth exceeding ± 6,25 % of the ‘centre operating frequency’; Technical note: The ‘centre operating frequency’ equals one half of the sum of the highest plus the lowest specified operating frequencies. (c) Capable of operating simultaneously on more than two carrier frequencies; (d) Capable of operating in synthetic aperture radar (SAR), inverse synthetic aperture radar (ISAR) or side-looking airborne radar (SLAR) mode; (e) Incorporating electronically steerable array antennae; (f) Capable of height-finding non-cooperative targets; (g) Specially designed for airborne (balloon or airframe mounted) operation and having Doppler ‘signal processing’ for the detection of moving targets; (h) Employing processing of radar signals and using any of the following: 1. ‘Radar spread spectrum’ techniques; or 2. ‘Radar frequency agility’ techniques; (i) Providing ground-based operation with a maximum ‘instrumented range’ exceeding 185 km; Note : Item (i) above does not apply to: (a) Fishing ground surveillance radar; (b) Ground radar equipment specially designed for en-route air traffic control and having all of the following: 1. A maximum ‘instrumented range’ of 500 km or less; 2. Configured so that radar target data can be transmitted only one way from the radar site to one or more civil ATC centres; 3. Contains no provisions for remote control of the radar scan rate from the en-route ATC centre; and 4. Permanently installed. (c) Weather balloon tracking radars. (j) Being ‘laser’ radar or Light Detection and Ranging (LIDAR) equipment and having any of the following: 1. ‘Space-qualified’; 2. Employing coherent heterodyne or homodyne detection techniques and having an angular resolution of less (better) than 20 μrad (microradians); or 3. Designed for carrying out airborne bathymetric littoral surveys to International Hydrographic Organization (IHO) Order 1a Standard (5th Edition, February 2008) for Hydrographic Surveys or better, and using one or more ‘lasers’ with a wavelength exceeding 400 nm but not exceeding 600 nm; Notes: 1. LIDAR equipment specially designed for surveying is only specified by 3. 2. The item above does not apply to LIDAR equipment specially designed for meteorological observation. 3. Parameters in the IHO Order 1a Standard (5th Edition, February 2008) are summarized as follows: Horizontal Accuracy (95 % confidence level) = 5 m + 5 % of depth. Depth Accuracy for Reduced Depths (95 % confidence level) = ± √(a 2 + (b * d) 2 ) where: a = 0,5 m = constant-depth error, i.e., the sum of all constant-depth errors b = 0,013 = factor of depth-dependent error b * d = depth-dependent error, i.e., the sum of all depth-dependent errors d = depth Feature Detection = Cubic features > 2 m in depths up to 40 m; 10 % of depth beyond 40 m. (k) Having ‘signal processing’ subsystems using ‘pulse compression’ and having any of the following: 1. A ‘pulse compression’ ratio exceeding 150; or 2. A compressed pulse width of less than 200 ns; or Note : Item 2. above does not apply to two-dimensional ‘marine radar’ or ‘vessel traffic service’ radar, having all of the following: (a) ‘Pulse compression’ ratio not exceeding 150; (b) Compressed pulse width of greater than 30 ns; (c) Single and rotating mechanically scanned antenna; (d) Peak output power not exceeding 250 W; and (e) Not capable of ‘frequency hopping’. (l) Having data processing subsystems and having any of the following: 1. ‘Automatic target tracking’ providing, at any antenna rotation, the predicted target position beyond the time of the next antenna beam passage; or Note : The item above does not apply to conflict alert capability in ATC systems, or ‘marine radar’. 2. Configured to provide superposition and correlation, or fusion, of target data within six seconds from two or more ‘geographically dispersed’ radar sensors to improve the aggregate performance beyond that of any single sensor specified in items (f) or (i). Note : The item above does not apply to systems, equipment and assemblies used for ‘vessel traffic services’. Technical notes: 1. For the purposes of this section, ‘marine radar’ is a radar that is used to navigate safely at sea, in inland waterways or in near-shore environments. 2. For the purposes of this section, ‘vessel traffic service’ is a vessel traffic monitoring and control service similar to air traffic control for ‘aircraft’.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.019
Code: 6A008
1. Radar systems, equipment and assemblies, having any of the following, and specially designed components therefor: Note : This section does not apply to: — Secondary Surveillance Radar (SSR); — Civil Automotive Radar; — Displays or monitors used for Air Traffic Control (ATC); — Meteorological (weather) Radar; — Precision Approach Radar (PAR) equipment conforming to International Civil Aviation Organization (ICAO) standards and employing electronically steerable linear (one-dimensional) arrays or mechanically positioned passive antennae. (a) Operating at frequencies from 40 GHz to 230 GHz and having any of the following: 1. An average output power exceeding 100 mW; or 2. Locating ‘accuracy’ of 1 m or less (better) in range and 0,2 degree or less (better) in azimuth; (b) A tunable bandwidth exceeding ± 6,25 % of the ‘centre operating frequency’; Technical note: The ‘centre operating frequency’ equals one half of the sum of the highest plus the lowest specified operating frequencies. (c) Capable of operating simultaneously on more than two carrier frequencies; (d) Capable of operating in synthetic aperture radar (SAR), inverse synthetic aperture radar (ISAR) or side-looking airborne radar (SLAR) mode; (e) Incorporating electronically steerable array antennae; (f) Capable of height-finding non-cooperative targets; (g) Specially designed for airborne (balloon or airframe mounted) operation and having Doppler ‘signal processing’ for the detection of moving targets; (h) Employing processing of radar signals and using any of the following: 1. ‘Radar spread spectrum’ techniques; or 2. ‘Radar frequency agility’ techniques; (i) Providing ground-based operation with a maximum ‘instrumented range’ exceeding 185 km; Note : Item (i) above does not apply to: (a) Fishing ground surveillance radar; (b) Ground radar equipment specially designed for en-route air traffic control and having all of the following: 1. A maximum ‘instrumented range’ of 500 km or less; 2. Configured so that radar target data can be transmitted only one way from the radar site to one or more civil ATC centres; 3. Contains no provisions for remote control of the radar scan rate from the en-route ATC centre; and 4. Permanently installed. (c) Weather balloon tracking radars. (j) Being ‘laser’ radar or Light Detection and Ranging (LIDAR) equipment and having any of the following: 1. ‘Space-qualified’; 2. Employing coherent heterodyne or homodyne detection techniques and having an angular resolution of less (better) than 20 μrad (microradians); or 3. Designed for carrying out airborne bathymetric littoral surveys to International Hydrographic Organization (IHO) Order 1a Standard (5th Edition, February 2008) for Hydrographic Surveys or better, and using one or more ‘lasers’ with a wavelength exceeding 400 nm but not exceeding 600 nm; Notes: 1. LIDAR equipment specially designed for surveying is only specified by 3. 2. The item above does not apply to LIDAR equipment specially designed for meteorological observation. 3. Parameters in the IHO Order 1a Standard (5th Edition, February 2008) are summarized as follows: Horizontal Accuracy (95 % confidence level) = 5 m + 5 % of depth. Depth Accuracy for Reduced Depths (95 % confidence level) = ± √(a 2 + (b * d) 2 ) where: a = 0,5 m = constant-depth error, i.e., the sum of all constant-depth errors b = 0,013 = factor of depth-dependent error b * d = depth-dependent error, i.e., the sum of all depth-dependent errors d = depth Feature Detection = Cubic features > 2 m in depths up to 40 m; 10 % of depth beyond 40 m. (k) Having ‘signal processing’ subsystems using ‘pulse compression’ and having any of the following: 1. A ‘pulse compression’ ratio exceeding 150; or 2. A compressed pulse width of less than 200 ns; or Note : Item 2. above does not apply to two-dimensional ‘marine radar’ or ‘vessel traffic service’ radar, having all of the following: (a) ‘Pulse compression’ ratio not exceeding 150; (b) Compressed pulse width of greater than 30 ns; (c) Single and rotating mechanically scanned antenna; (d) Peak output power not exceeding 250 W; and (e) Not capable of ‘frequency hopping’. (l) Having data processing subsystems and having any of the following: 1. ‘Automatic target tracking’ providing, at any antenna rotation, the predicted target position beyond the time of the next antenna beam passage; or Note : The item above does not apply to conflict alert capability in ATC systems, or ‘marine radar’. 2. Configured to provide superposition and correlation, or fusion, of target data within six seconds from two or more ‘geographically dispersed’ radar sensors to improve the aggregate performance beyond that of any single sensor specified in items (f) or (i). Note : The item above does not apply to systems, equipment and assemblies used for ‘vessel traffic services’. Technical notes: 1. For the purposes of this section, ‘marine radar’ is a radar that is used to navigate safely at sea, in inland waterways or in near-shore environments. 2. For the purposes of this section, ‘vessel traffic service’ is a vessel traffic monitoring and control service similar to air traffic control for ‘aircraft’.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.019
Code: 6A008
Gravity meters (gravimeters) and gravity gradiometers, as follows: (a) Gravity meters designed or modified for ground use and having a static ‘accuracy’ of less (better) than 10 μGal; Note : Item (a) does not apply to ground gravity meters of the quartz element (Worden) type. (b) Gravity meters designed for mobile platforms and having all of the following: 1. A static ‘accuracy’ of less (better) than 0,7 mGal; and 2. An in-service (operational) ‘accuracy’ of less (better) than 0,7 mGal having a ‘time-to-steady-state registration’ of less than 2 minutes under any combination of attendant corrective compensations and motional influences; Technical note : For the purposes of item (b), ‘time-to-steady-state registration’ (also referred to as the gravimeter's response time) is the time over which the disturbing effects of platform-induced accelerations (high-frequency noise) are reduced. (c) Gravity gradiometers.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.018
Code: 6A007
Gravity meters (gravimeters) and gravity gradiometers, as follows: (a) Gravity meters designed or modified for ground use and having a static ‘accuracy’ of less (better) than 10 μGal; Note : Item (a) does not apply to ground gravity meters of the quartz element (Worden) type. (b) Gravity meters designed for mobile platforms and having all of the following: 1. A static ‘accuracy’ of less (better) than 0,7 mGal; and 2. An in-service (operational) ‘accuracy’ of less (better) than 0,7 mGal having a ‘time-to-steady-state registration’ of less than 2 minutes under any combination of attendant corrective compensations and motional influences; Technical note : For the purposes of item (b), ‘time-to-steady-state registration’ (also referred to as the gravimeter's response time) is the time over which the disturbing effects of platform-induced accelerations (high-frequency noise) are reduced. (c) Gravity gradiometers.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.018
Code: 6A007
Imaging cameras incorporating ‘focal plane arrays’ having any of the following: a. Incorporating non-‘space-qualified’‘focal plane arrays’ having any of the following: 1. Having all of the following: a. Individual elements with a peak response within the wavelength range exceeding 900 nm but not exceeding 1 050 nm; and b. Any of the following: 1. A response ‘time constant’ of less than 0,5 ns; or 2. Specially designed or modified to achieve ‘charge multiplication’ and having a maximum ‘radiant sensitivity’ exceeding 10 mA/W; 2. Having all of the following: a. Individual elements with a peak response in the wavelength range exceeding 1 050 nm but not exceeding 1 200 nm; and b. Any of the following: 1. A response ‘time constant’ of 95 ns or less; or 2. Specially designed or modified to achieve ‘charge multiplication’ and having a maximum ‘radiant sensitivity’ exceeding 10 mA/W; or 3. Being non-‘space-qualified’ non-linear (two-dimensional) ‘focal plane arrays’ having individual elements with a peak response in the wavelength range exceeding 1 200 nm but not exceeding 30 000 nm; 4. Being non-‘space-qualified’ linear (one-dimensional) ‘focal plane arrays’ having all of the following: a. Individual elements with a peak response in the wavelength range exceeding 1 200 nm but not exceeding 3 000 nm; and b. Any of the following: 1. A ratio of ‘scan direction’ dimension of the detector element to the ‘cross-scan direction’ dimension of the detector element of less than 3,8; or 2. Signal processing in the detector elements; or 5. Being non-‘space-qualified’ linear (one-dimensional) ‘focal plane arrays’ having individual elements with a peak response in the wavelength range exceeding 3 000 nm but not exceeding 30 000 nm; b. Incorporating non-‘space-qualified’ non-linear (two-dimensional) infrared ‘focal plane arrays’ based on ‘microbolometer’ material having individual elements with an unfiltered response in the wavelength range equal to or exceeding 8 000 nm but not exceeding 14 000 nm; or c. Incorporating non-‘space-qualified’‘focal plane arrays’ having all of the following: 1. Individual detector elements with a peak response in the wavelength range exceeding 400 nm but not exceeding 900 nm; 2. Specially designed or modified to achieve ‘charge multiplication’ and having a maximum ‘radiant sensitivity’ exceeding 10 mA/W for wavelengths exceeding 760 nm; and 3. Greater than 32 elements. Notes: 1. Imaging cameras specified in item 4 above include ‘focal plane arrays’ combined with sufficient ‘signal processing’ electronics, beyond the read-out integrated circuit, to enable as a minimum the output of an analogue or digital signal once power is supplied. 2. Item 4.a. does not apply to imaging cameras incorporating linear ‘focal plane arrays’ with 12 elements or fewer, not employing time-delay-and-integration within the element and designed for any of the following: (a) Industrial or civilian intrusion alarm, traffic or industrial movement control or counting systems; (b) Industrial equipment used for inspection or monitoring of heat flows in buildings, equipment or industrial processes; (c) Industrial equipment used for inspection, sorting or analysis of the properties of materials; (d) Equipment specially designed for laboratory use; or (e) Medical equipment. 3. Item 4.b. does not apply to imaging cameras having any of the following: (a) A maximum frame rate equal to or less than 9 Hz; (b) Having all of the following: 1. Having a minimum horizontal or vertical ‘Instantaneous Field of View (IFOV)’ of at least 10 mrad (milliradians); 2. Incorporating a fixed focal-length lens that is not designed to be removed; 3. Not incorporating a ‘direct view’ display; and Technical note: ‘Direct view’ refers to an imaging camera operating in the infrared spectrum that presents a visual image to a human observer using a near-to-eye microdisplay incorporating any light-security mechanism. 4. Having any of the following: a. No facility to obtain a viewable image of the detected field of view; or b. The camera is designed for a single kind of application and designed not to be user modified; or Technical note: ‘Instantaneous Field of View (IFOV)’ specified in note 3.b. is the lesser figure of the ‘Horizontal IFOV’ or the ‘Vertical IFOV’. ‘Horizontal IFOV’ = horizontal Field of View (FOV)/number of horizontal detector elements. ‘Vertical IFOV’ = vertical Field of View (FOV)/number of vertical detector elements. (c) The camera is specially designed for installation into a civilian passenger land vehicle and having all of the following: 1. The placement and configuration of the camera within the vehicle are solely to assist the driver in the safe operation of the vehicle.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.009
Code: 6A003
Imaging cameras incorporating ‘focal plane arrays’ having any of the following: a. Incorporating non-‘space-qualified’‘focal plane arrays’ having any of the following: 1. Having all of the following: a. Individual elements with a peak response within the wavelength range exceeding 900 nm but not exceeding 1 050 nm; and b. Any of the following: 1. A response ‘time constant’ of less than 0,5 ns; or 2. Specially designed or modified to achieve ‘charge multiplication’ and having a maximum ‘radiant sensitivity’ exceeding 10 mA/W; 2. Having all of the following: a. Individual elements with a peak response in the wavelength range exceeding 1 050 nm but not exceeding 1 200 nm; and b. Any of the following: 1. A response ‘time constant’ of 95 ns or less; or 2. Specially designed or modified to achieve ‘charge multiplication’ and having a maximum ‘radiant sensitivity’ exceeding 10 mA/W; or 3. Being non-‘space-qualified’ non-linear (two-dimensional) ‘focal plane arrays’ having individual elements with a peak response in the wavelength range exceeding 1 200 nm but not exceeding 30 000 nm; 4. Being non-‘space-qualified’ linear (one-dimensional) ‘focal plane arrays’ having all of the following: a. Individual elements with a peak response in the wavelength range exceeding 1 200 nm but not exceeding 3 000 nm; and b. Any of the following: 1. A ratio of ‘scan direction’ dimension of the detector element to the ‘cross-scan direction’ dimension of the detector element of less than 3,8; or 2. Signal processing in the detector elements; or 5. Being non-‘space-qualified’ linear (one-dimensional) ‘focal plane arrays’ having individual elements with a peak response in the wavelength range exceeding 3 000 nm but not exceeding 30 000 nm; b. Incorporating non-‘space-qualified’ non-linear (two-dimensional) infrared ‘focal plane arrays’ based on ‘microbolometer’ material having individual elements with an unfiltered response in the wavelength range equal to or exceeding 8 000 nm but not exceeding 14 000 nm; or c. Incorporating non-‘space-qualified’‘focal plane arrays’ having all of the following: 1. Individual detector elements with a peak response in the wavelength range exceeding 400 nm but not exceeding 900 nm; 2. Specially designed or modified to achieve ‘charge multiplication’ and having a maximum ‘radiant sensitivity’ exceeding 10 mA/W for wavelengths exceeding 760 nm; and 3. Greater than 32 elements. Notes: 1. Imaging cameras specified in item 4 above include ‘focal plane arrays’ combined with sufficient ‘signal processing’ electronics, beyond the read-out integrated circuit, to enable as a minimum the output of an analogue or digital signal once power is supplied. 2. Item 4.a. does not apply to imaging cameras incorporating linear ‘focal plane arrays’ with 12 elements or fewer, not employing time-delay-and-integration within the element and designed for any of the following: (a) Industrial or civilian intrusion alarm, traffic or industrial movement control or counting systems; (b) Industrial equipment used for inspection or monitoring of heat flows in buildings, equipment or industrial processes; (c) Industrial equipment used for inspection, sorting or analysis of the properties of materials; (d) Equipment specially designed for laboratory use; or (e) Medical equipment. 3. Item 4.b. does not apply to imaging cameras having any of the following: (a) A maximum frame rate equal to or less than 9 Hz; (b) Having all of the following: 1. Having a minimum horizontal or vertical ‘Instantaneous Field of View (IFOV)’ of at least 10 mrad (milliradians); 2. Incorporating a fixed focal-length lens that is not designed to be removed; 3. Not incorporating a ‘direct view’ display; and Technical note: ‘Direct view’ refers to an imaging camera operating in the infrared spectrum that presents a visual image to a human observer using a near-to-eye microdisplay incorporating any light-security mechanism. 4. Having any of the following: a. No facility to obtain a viewable image of the detected field of view; or b. The camera is designed for a single kind of application and designed not to be user modified; or Technical note: ‘Instantaneous Field of View (IFOV)’ specified in note 3.b. is the lesser figure of the ‘Horizontal IFOV’ or the ‘Vertical IFOV’. ‘Horizontal IFOV’ = horizontal Field of View (FOV)/number of horizontal detector elements. ‘Vertical IFOV’ = vertical Field of View (FOV)/number of vertical detector elements. (c) The camera is specially designed for installation into a civilian passenger land vehicle and having all of the following: 1. The placement and configuration of the camera within the vehicle are solely to assist the driver in the safe operation of the vehicle.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.009
Code: 6A003
Imaging cameras incorporating image intensifier tubes having any of the following: a. Having all of the following: 1. A peak response in the wavelength range exceeding 400 nm but not exceeding 1 050 nm; 2. Electron image amplification using any of the following: a. A microchannel plate with a hole pitch (centre-to-centre spacing) of 12 μm or less; or b. An electron sensing device with a non-binned pixel pitch of 500 μm or less, specially designed or modified to achieve ‘charge multiplication’ other than by a microchannel plate; and 3. Any of the following photocathodes: a. Multialkali photocathodes (e.g., S-20 and S-25) having a luminous sensitivity exceeding 350 μA/lm; b. GaAs or GaInAs photocathodes; or c. Other ‘III/V compound’ semiconductor photocathodes having a maximum ‘radiant sensitivity’ exceeding 10 mA/W; or b. Having all of the following: 1. A peak response in the wavelength range exceeding 1 050 nm but not exceeding 1 800 nm; 2. Electron image amplification using any of the following: a. A microchannel plate with a hole pitch (centre-to-centre spacing) of 12 μm or less; or b. An electron sensing device with a non-binned pixel pitch of 500 μm or less, specially designed or modified to achieve ‘charge multiplication’ other than by a microchannel plate; and 3. ‘III/V compound’ semiconductor (e.g., GaAs or GaInAs) photocathodes and transferred electron photocathodes, having a maximum ‘radiant sensitivity’ exceeding 15 mA/W;
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.008
Code: 6A003
Imaging cameras incorporating image intensifier tubes having any of the following: a. Having all of the following: 1. A peak response in the wavelength range exceeding 400 nm but not exceeding 1 050 nm; 2. Electron image amplification using any of the following: a. A microchannel plate with a hole pitch (centre-to-centre spacing) of 12 μm or less; or b. An electron sensing device with a non-binned pixel pitch of 500 μm or less, specially designed or modified to achieve ‘charge multiplication’ other than by a microchannel plate; and 3. Any of the following photocathodes: a. Multialkali photocathodes (e.g., S-20 and S-25) having a luminous sensitivity exceeding 350 μA/lm; b. GaAs or GaInAs photocathodes; or c. Other ‘III/V compound’ semiconductor photocathodes having a maximum ‘radiant sensitivity’ exceeding 10 mA/W; or b. Having all of the following: 1. A peak response in the wavelength range exceeding 1 050 nm but not exceeding 1 800 nm; 2. Electron image amplification using any of the following: a. A microchannel plate with a hole pitch (centre-to-centre spacing) of 12 μm or less; or b. An electron sensing device with a non-binned pixel pitch of 500 μm or less, specially designed or modified to achieve ‘charge multiplication’ other than by a microchannel plate; and 3. ‘III/V compound’ semiconductor (e.g., GaAs or GaInAs) photocathodes and transferred electron photocathodes, having a maximum ‘radiant sensitivity’ exceeding 15 mA/W;
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.008
Code: 6A003
Scanning cameras and scanning camera systems; a. A peak response in the wavelength range exceeding 10 nm, but not exceeding 30 000 nm; b. Linear detector arrays with more than 8 192 elements per array; and c. Mechanical scanning in one direction; Note : The item above does not apply to scanning cameras and scanning camera systems, specially designed for any of the following: (a) Industrial or civilian photocopiers; (b) Image scanners specially designed for civil, stationary, close proximity scanning applications (e.g., reproduction of images or print contained in documents, artwork or photographs); or (c) Medical equipment.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.007
Code: 6A003
Scanning cameras and scanning camera systems; a. A peak response in the wavelength range exceeding 10 nm, but not exceeding 30 000 nm; b. Linear detector arrays with more than 8 192 elements per array; and c. Mechanical scanning in one direction; Note : The item above does not apply to scanning cameras and scanning camera systems, specially designed for any of the following: (a) Industrial or civilian photocopiers; (b) Image scanners specially designed for civil, stationary, close proximity scanning applications (e.g., reproduction of images or print contained in documents, artwork or photographs); or (c) Medical equipment.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.007
Code: 6A003
Imaging cameras, as follows: Note : The item above does not apply to television or video cameras, specially designed for television broadcasting. 1. Video cameras incorporating solid-state sensors, having a peak response in the wavelength range exceeding 10 nm, but not exceeding 30 000 nm and having all of the following: a. Having any of the following: 1. More than 4 × 10 6 ‘active pixels’ per solid-state array for monochrome (black and white) cameras; 2. More than 4 × 10 6 ‘active pixels’ per solid-state array for colour cameras incorporating three solid-state arrays; or 3. More than 12 × 10 6 ‘active pixels’ for solid-state array colour cameras incorporating one solid-state array; and b. Having any of the following: 1. Optical mirrors specified below; 2. Optical control equipment specified below; or 3. The capability for annotating internally generated ‘camera tracking data’; Technical notes: 1. For the purposes of this entry, digital video cameras should be evaluated by the maximum number of ‘active pixels’ used for capturing moving images. 2. For the purposes of this entry, ‘camera tracking data’ is the information necessary to define camera line of sight orientation with respect to the Earth. This includes: (a) the horizontal angle the camera line of sight makes with respect to the Earth's magnetic field direction; and (b) the vertical angle between the camera line of sight and the Earth's horizon.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.006
Code: 6A003
Imaging cameras, as follows: Note : The item above does not apply to television or video cameras, specially designed for television broadcasting. 1. Video cameras incorporating solid-state sensors, having a peak response in the wavelength range exceeding 10 nm, but not exceeding 30 000 nm and having all of the following: a. Having any of the following: 1. More than 4 × 10 6 ‘active pixels’ per solid-state array for monochrome (black and white) cameras; 2. More than 4 × 10 6 ‘active pixels’ per solid-state array for colour cameras incorporating three solid-state arrays; or 3. More than 12 × 10 6 ‘active pixels’ for solid-state array colour cameras incorporating one solid-state array; and b. Having any of the following: 1. Optical mirrors specified below; 2. Optical control equipment specified below; or 3. The capability for annotating internally generated ‘camera tracking data’; Technical notes: 1. For the purposes of this entry, digital video cameras should be evaluated by the maximum number of ‘active pixels’ used for capturing moving images. 2. For the purposes of this entry, ‘camera tracking data’ is the information necessary to define camera line of sight orientation with respect to the Earth. This includes: (a) the horizontal angle the camera line of sight makes with respect to the Earth's magnetic field direction; and (b) the vertical angle between the camera line of sight and the Earth's horizon.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.006
Code: 6A003
High-speed cinema recording cameras using any film format from 8 mm to 16 mm inclusive, in which the film is continuously advanced throughout the recording period, and that are capable of recording at framing rates exceeding 13 150 frames/s; Note : The item above does not apply to cinema recording cameras designed for civil purposes. 2. Mechanical high-speed cameras, in which the film does not move, capable of recording at rates exceeding 1 000 000 frames/s for the full framing height of 35 mm film, or at proportionately higher rates for lesser frame heights, or at proportionately lower rates for greater frame heights; 3. Mechanical or electronic streak cameras as follows: a. Mechanical streak cameras having writing speeds exceeding 10 mm/μs; b. Electronic streak cameras having temporal resolution better than 50 ns; 4. Electronic framing cameras having a speed exceeding 1 000 000 frames/s; 5. Electronic cameras having all of the following: a. An electronic shutter speed (gating capability) of less than 1 μs per full frame; and b. A read-out time allowing a framing rate of more than 125 full frames per second; 6. Plug-ins having all of the following characteristics: a. Specially designed for instrumentation cameras which have modular structures and which are specified in this item; and b. Enabling these cameras to meet the characteristics specified above, according to the manufacturer's specifications;
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.005
Code: 6A003
High-speed cinema recording cameras using any film format from 8 mm to 16 mm inclusive, in which the film is continuously advanced throughout the recording period, and that are capable of recording at framing rates exceeding 13 150 frames/s; Note : The item above does not apply to cinema recording cameras designed for civil purposes. 2. Mechanical high-speed cameras, in which the film does not move, capable of recording at rates exceeding 1 000 000 frames/s for the full framing height of 35 mm film, or at proportionately higher rates for lesser frame heights, or at proportionately lower rates for greater frame heights; 3. Mechanical or electronic streak cameras as follows: a. Mechanical streak cameras having writing speeds exceeding 10 mm/μs; b. Electronic streak cameras having temporal resolution better than 50 ns; 4. Electronic framing cameras having a speed exceeding 1 000 000 frames/s; 5. Electronic cameras having all of the following: a. An electronic shutter speed (gating capability) of less than 1 μs per full frame; and b. A read-out time allowing a framing rate of more than 125 full frames per second; 6. Plug-ins having all of the following characteristics: a. Specially designed for instrumentation cameras which have modular structures and which are specified in this item; and b. Enabling these cameras to meet the characteristics specified above, according to the manufacturer's specifications;
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.005
Code: 6A003
Cameras, systems or equipment, and components therefor, as follows: (a) Instrumentation cameras and specially designed components therefor, as follows: Note : Instrumentation cameras, specified above, with modular structures should be evaluated by their maximum capability, using plug-ins available according to the camera manufacturer's specifications.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.004
Code: 6A003
Cameras, systems or equipment, and components therefor, as follows: (a) Instrumentation cameras and specially designed components therefor, as follows: Note : Instrumentation cameras, specified above, with modular structures should be evaluated by their maximum capability, using plug-ins available according to the camera manufacturer's specifications.
Authority: EU
Prohibited Supply To: IRKP
Program: KP
EU Code: IX.A6.004
Code: 6A003
‘Substrates’ specified in item 5 above with at least one epitaxial layer of silicon carbide, gallium nitride, aluminium nitride or aluminium gallium nitride.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.044
Code: 3C006
‘Substrates’ specified in item 5 above with at least one epitaxial layer of silicon carbide, gallium nitride, aluminium nitride or aluminium gallium nitride.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.044
Code: 3C006
Silicon carbide (SiC), gallium nitride (GaN), aluminium nitride (AlN) or aluminium gallium nitride (AlGaN) semiconductor ‘substrates’, or ingots, boules or other preforms of those materials, having resistivities greater than 10 000 ohm-cm at 20 °C.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.043
Code: 3C005
Silicon carbide (SiC), gallium nitride (GaN), aluminium nitride (AlN) or aluminium gallium nitride (AlGaN) semiconductor ‘substrates’, or ingots, boules or other preforms of those materials, having resistivities greater than 10 000 ohm-cm at 20 °C.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.043
Code: 3C005
Hydrides of phosphorus, arsenic or antimony, having a purity better than 99,999 %, even diluted in inert gases or hydrogen. Note : The item above does not apply to hydrides containing 20 % molar or more of inert gases or hydrogen.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.042
Code: 3C004
Hydrides of phosphorus, arsenic or antimony, having a purity better than 99,999 %, even diluted in inert gases or hydrogen. Note : The item above does not apply to hydrides containing 20 % molar or more of inert gases or hydrogen.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.042
Code: 3C004
Organo-inorganic compounds: (a) Organo-metallic compounds of aluminium, gallium or indium, having a purity (metal basis) better than 99,999 %; (b) Organo-arsenic, organo-antimony and organo-phosphorus compounds, having a purity (inorganic element basis) better than 99,999 %.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.041
Code: 3C003
Organo-inorganic compounds: (a) Organo-metallic compounds of aluminium, gallium or indium, having a purity (metal basis) better than 99,999 %; (b) Organo-arsenic, organo-antimony and organo-phosphorus compounds, having a purity (inorganic element basis) better than 99,999 %.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.041
Code: 3C003
Resist materials as follows and ‘substrates’ coated with the following resists: (a) Resists designed for semiconductor lithography as follows: 1. Positive resists adjusted (optimized) for use at wavelengths less than 245 nm but equal to or greater than 15 nm; 2. Resists adjusted (optimized) for use at wavelengths less than 15 nm but greater than 1 nm; (b) All resists designed for use with electron beams or ion beams, with a sensitivity of 0,01 μcoulomb/mm 2 or better; (c) All resists optimized for surface imaging technologies; (d) All resists designed or optimized for use with imprint lithography equipment capable of producing features of 45 nm or less that use either a thermal or photo-curable process.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.040
Code: 3C002
Resist materials as follows and ‘substrates’ coated with the following resists: (a) Resists designed for semiconductor lithography as follows: 1. Positive resists adjusted (optimized) for use at wavelengths less than 245 nm but equal to or greater than 15 nm; 2. Resists adjusted (optimized) for use at wavelengths less than 15 nm but greater than 1 nm; (b) All resists designed for use with electron beams or ion beams, with a sensitivity of 0,01 μcoulomb/mm 2 or better; (c) All resists optimized for surface imaging technologies; (d) All resists designed or optimized for use with imprint lithography equipment capable of producing features of 45 nm or less that use either a thermal or photo-curable process.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.040
Code: 3C002
Hetero-epitaxial materials consisting of a ‘substrate’ having stacked epitaxially grown multiple layers with any of the following: (a) Silicon (Si); (b) Germanium (Ge); (c) Silicon Carbide (SiC); or (d) ‘III/V compounds’ of gallium or indium. Note : This item does not apply to a ‘substrate’ having one or more P-type epitaxial layers of GaN, InGaN, AlGaN, InAlN, InAlGaN, GaP, GaAs, AlGaAs, InP, InGaP, AlInP or InGaAlP, independent of the sequence of the elements, except if the P-type epitaxial layer is between N-type layers.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.039
Code: 3C001
Hetero-epitaxial materials consisting of a ‘substrate’ having stacked epitaxially grown multiple layers with any of the following: (a) Silicon (Si); (b) Germanium (Ge); (c) Silicon Carbide (SiC); or (d) ‘III/V compounds’ of gallium or indium. Note : This item does not apply to a ‘substrate’ having one or more P-type epitaxial layers of GaN, InGaN, AlGaN, InAlN, InAlGaN, GaP, GaAs, AlGaAs, InP, InGaP, AlInP or InGaAlP, independent of the sequence of the elements, except if the P-type epitaxial layer is between N-type layers.
Authority: EU
Prohibited Supply To: KP
Program: KP
EU Code: IX.A3.039
Code: 3C001

Search sanctioned goods across UK and EU export control lists in one place. This tool covers dual-use items, military equipment, and other restricted goods and technologies. Each entry includes the specific goods description, issuing authority, countries subject to import or export restrictions, and the relevant sanctions programme. This helps compliance and trade teams determine whether an item is subject to import or export prohibitions.

Use the filters to narrow results by authority, target state, or sanctions programme. Whether you’re checking a single HS code or reviewing an entire category, the sanctioned goods list is updated as new designations and programme consolidated changes are published.

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Pulse radar cross-section measurement systems having transmit pulse widths of 100 ns or less, and specially designed components therefor.

Pulse radar cross-section measurement systems having transmit pulse widths of 100 ns or less, and specially designed components therefor.

Equipment to produce, align and calibrate land-based gravity meters with a static ‘accuracy’ of better than 0,1 mGal.

Equipment to produce, align and calibrate land-based gravity meters with a static ‘accuracy’ of better than 0,1 mGal.

‘Substrates’ specified in item 5 above with at least one epitaxial layer of silicon carbide, gallium nitride, aluminium nitride or aluminium gallium nitride.

‘Substrates’ specified in item 5 above with at least one epitaxial layer of silicon carbide, gallium nitride, aluminium nitride or aluminium gallium nitride.

Silicon carbide (SiC), gallium nitride (GaN), aluminium nitride (AlN) or aluminium gallium nitride (AlGaN) semiconductor ‘substrates’, or ingots, boules or other preforms of those materials, having resistivities greater than 10 000 ohm-cm at 20 °C.

Silicon carbide (SiC), gallium nitride (GaN), aluminium nitride (AlN) or aluminium gallium nitride (AlGaN) semiconductor ‘substrates’, or ingots, boules or other preforms of those materials, having resistivities greater than 10 000 ohm-cm at 20 °C.

Hydrides of phosphorus, arsenic or antimony, having a purity better than 99,999 %, even diluted in inert gases or hydrogen. Note : The item above does not apply to hydrides containing 20 % molar or more of inert gases or hydrogen.

Hydrides of phosphorus, arsenic or antimony, having a purity better than 99,999 %, even diluted in inert gases or hydrogen. Note : The item above does not apply to hydrides containing 20 % molar or more of inert gases or hydrogen.

Organo-inorganic compounds: (a) Organo-metallic compounds of aluminium, gallium or indium, having a purity (metal basis) better than 99,999 %; (b) Organo-arsenic, organo-antimony and organo-phosphorus compounds, having a purity (inorganic element basis) better than 99,999 %.

Organo-inorganic compounds: (a) Organo-metallic compounds of aluminium, gallium or indium, having a purity (metal basis) better than 99,999 %; (b) Organo-arsenic, organo-antimony and organo-phosphorus compounds, having a purity (inorganic element basis) better than 99,999 %.

Filters

Search results

Pulse radar cross-section measurement systems having transmit pulse widths of 100 ns or less, and specially designed components therefor.

Pulse radar cross-section measurement systems having transmit pulse widths of 100 ns or less, and specially designed components therefor.

Equipment to produce, align and calibrate land-based gravity meters with a static ‘accuracy’ of better than 0,1 mGal.

Equipment to produce, align and calibrate land-based gravity meters with a static ‘accuracy’ of better than 0,1 mGal.

‘Substrates’ specified in item 5 above with at least one epitaxial layer of silicon carbide, gallium nitride, aluminium nitride or aluminium gallium nitride.

‘Substrates’ specified in item 5 above with at least one epitaxial layer of silicon carbide, gallium nitride, aluminium nitride or aluminium gallium nitride.

Silicon carbide (SiC), gallium nitride (GaN), aluminium nitride (AlN) or aluminium gallium nitride (AlGaN) semiconductor ‘substrates’, or ingots, boules or other preforms of those materials, having resistivities greater than 10 000 ohm-cm at 20 °C.

Silicon carbide (SiC), gallium nitride (GaN), aluminium nitride (AlN) or aluminium gallium nitride (AlGaN) semiconductor ‘substrates’, or ingots, boules or other preforms of those materials, having resistivities greater than 10 000 ohm-cm at 20 °C.

Hydrides of phosphorus, arsenic or antimony, having a purity better than 99,999 %, even diluted in inert gases or hydrogen. Note : The item above does not apply to hydrides containing 20 % molar or more of inert gases or hydrogen.

Hydrides of phosphorus, arsenic or antimony, having a purity better than 99,999 %, even diluted in inert gases or hydrogen. Note : The item above does not apply to hydrides containing 20 % molar or more of inert gases or hydrogen.

Organo-inorganic compounds: (a) Organo-metallic compounds of aluminium, gallium or indium, having a purity (metal basis) better than 99,999 %; (b) Organo-arsenic, organo-antimony and organo-phosphorus compounds, having a purity (inorganic element basis) better than 99,999 %.

Organo-inorganic compounds: (a) Organo-metallic compounds of aluminium, gallium or indium, having a purity (metal basis) better than 99,999 %; (b) Organo-arsenic, organo-antimony and organo-phosphorus compounds, having a purity (inorganic element basis) better than 99,999 %.