Microscopes, related equipment and detectors, as follows— a scanning electron microscopes (SEM); b scanning auger microscopes; c transmission electron microscopes (TEM); d atomic force microscopes (AFM); e scanning force microscopes (SFM); f equipment and detectors specially designed for use with the microscopes specified in sub-paragraphs (a) to (e), employing any of the following— i X-ray photo spectroscopy (XPS); ii energy-dispersive X-ray spectroscopy (EDX, EDS); iii electron back scatter detector (EBSD) systems; iv electron spectroscopy for chemical analysis (ESCA).