Instruments and apparatus for measuring or checking semiconductor wafers or devices

Radar systems, equipment and major components, other than those specified in the CML or in Regulation (EU) 2021/821, and specially designed components therefor, as follows: a. Airborne radar equipment, other than those specified in the CML or in Regulation (EU) 2021/821, and specially designed components therefor; b. ‘Space-qualified’‘laser’ radar or Light Detection and Ranging (LIDAR) equipment specially designed for surveying or for meteorological observation; c. Millimeter wave enhanced vision radar imaging systems specially designed for rotary wing aircraft and having all of the following: 1. Operates at a frequency of 94 GHz; 2. An average output power of less than 20 mW; 3. Radar beam width of 1 degree; and 4. Operating range equal to or greater than 1 500 m

Oscilloscopes, spectrum analysers and other instruments and apparatus for measuring or checking electrical quantities (excluding meters of heading 9028 ); instruments and apparatus for measuring or detecting alpha, beta, gamma, x-ray, cosmic or other ionising radiations