Last Updated: April 11, 2026
Last Updated: April 11, 2026
Instruments and apparatus for measuring or checking semiconductor wafers or devices
Code
9030 82 00
EU Code
X.A.I.002.a
Category
ANNEX VII - List of goods and technology referred to in Articles 2a(1) and 2b(1)
Subcategory
Telecommunications and Information Security
Prohibited Supply To
RUAuthority
EU
Document
EU Regulation 833/2014
Notes
- Telecommunications test equipment, other than those specified in the CML or in Regulation (EU) 2021/821.
- Electronic test equipment, other than those specified in the CML or in Regulation (EU) 2021/821
- Equipment specially designed for the inspection or testing of semiconductor devices, integrated circuits and ‘electronic assemblies’, as follows, and systems incorporating or having the characteristics of such equipment: …..
- Other equipment specially designed for the test, inspection, or ‘production’ of navigation and avionics equipment.
Goods
- Radar systems, equipment and major components, other than those specified in the CML or in Regulation (EU) 2021/821, and specially designed components therefor, as follows: a. Airborne radar equipment, other than those specified in the CML or in Regulation (EU) 2021/821, and specially designed components therefor; b. ‘Space-qualified’‘laser’ radar or Light Detection and Ranging (LIDAR) equipment specially designed for surveying or for meteorological observation; c. Millimeter wave enhanced vision radar imaging systems specially designed for rotary wing aircraft and having all of the following: 1. Operates at a frequency of 94 GHz; 2. An average output power of less than 20 mW; 3. Radar beam width of 1 degree; and 4. Operating range equal to or greater than 1 500 m
- Oscilloscopes, spectrum analysers and other instruments and apparatus for measuring or checking electrical quantities (excluding meters of heading 9028 ); instruments and apparatus for measuring or detecting alpha, beta, gamma, x-ray, cosmic or other ionising radiations
- Instruments and apparatus for measuring or checking semiconductor wafers or devices
Program information
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