Microscopes and related equipment and detectors, as follows: (a) Scanning Electron Microscopes; (b) Scanning Auger Microscopes; (c) Transmission Electron Microscopes; (d) Atomic Force Microscopes; (e) Scanning Force Microscopes; (f) Equipment and detectors, specially designed for use with the microscopes specified in II.A6.013 a) to e) above, employing any of the following materials analysis techniques: 1. X-ray Photo Spectroscopy (XPS); 2. Energy-dispersive X-ray Spectroscopy (EDX, EDS); or 3. Electron Spectroscopy for Chemical Analysis (ESCA).